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Samsung SP0802N - Chapter 2: Description; Introduction; Key Features

Samsung SP0802N
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PALO
12
SAMSUNG HARD DISK DRIVE
7. How to use HUTIL Program
1) Before you start
HUTIL support from Voyager11P to PALO series.(HUTIL 1.12 version)
(HUTIL has be en upgrading constantly whenever new model comes out.)
- Preparation before use
Diskette or HDD containing HUTIL.EXE should be boot-up to MS-DOS mode,that is,
should be contained IO.SYS, MSDOS.SYS,COMMAND.COM (IO.SYS, MSDOS.SYS: hidden file).
And also HUTIL.CFG is required.
2) Explanation of each menu
OPTION - ABOUT HUTIL : Version of HUTIL.
OPTION - DOS SHELL : Execute DOS Shell. If you want back to HUTIL, input EXIT.
EXIT TO DOS : End HUTIL program.
OPTION - DRIVE INFORMATION : Open the information window about the target HDD.
Press
ESC
to close.
TEST - READ ALL: Display error list when error is occurred after reading whole cylinder.
Message will be appeared if the test time delay is over 20 seconds compared
with other normal HDD. In this case, HDD may have problem. (Progress
sequential read test from cyl. #0 to the last cylinder. No Defect Free.
- Refer to a ttachment below.)
TEST - READ FROM : Read from the designated cylinder and head to the last cylinder.
Press ESC to stop in the middle.
TEST - WRITE ALL: Write 00h on all cylinder except maintenance cylinder.
All d ata will be removed. (Even partition table, boot sector & FAT)
TEST - WRITE FROM : Write from the designate cylinder and head to the last cylinder.
INFORMATION - NEW DEFECT LIST : View the error list in memory.
TEST - BURN IN : Download burn-In script to HDD.
TEST - DEFECT FREE : Progress after
Read Drive
command.
Defect free operation for the defects in the error list.
TEST - SHORT TEST : Menu for random read test, no defect free test.
TEST - LONG TEST : Read test from the first cylinder to the last in order,
no defect free test.
TEST - LONG TEST & DF : Cu rrent auto test.Check defect and defect free during read test
examine defect free again.
INFORMATION - NEW DEFECT MAP : Show defect on drive in graphic mode. These defects are
invisible because of do ne then these are added after defect
free done B/I & Read test or Auto test separately.
INFORMATION - GROWN DEFECT MAP : Show the defects in graphic mode during HUTIL program.
Moving along cursor with up/down arrow key, these keys
are indicated t he location of defects in the right list
on disk. This location is agreed with the real location
because skew was concerned in that already.
The color of an arrow is agre ed with those of head in
which defect occurred.

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