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Tektronix 576 - Page 54

Tektronix 576
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add
ed
in t
h
e
ste
p
generator
circuit,
t
he zero
ste
p
level
may
range
from
0
to
10
volts
.)
T
he
out
p
ut
end of
t
he current
setti
n
g
resistors
is
con-
nected
t
h
roug
h
t
he device
un
d
er test
to
groun
d
.
Wh
en
volt-
age
ste
p
s
of
1
volt
p
er
ste
p
are
app
lie
d
between
t
he
in
put
en
d of
t
h
e
current
setting
resistors
an
d
groun
d
,
current
ste
p
s
of
variable
am
p
litu
d
e
flow
t
h
roug
h
t
h
e d
evice
un
d
er
test
.
T
he cu
r
rent
am
p
litu
de
of
t
h
e
steps
is
d
etermine
d
by
A
MPL
IT
UDE
switch S
W
195
(see
Ste
p
Generator
Switc
h
ing
sc
hematic),
w
h
ic
h
c
h
ooses
various
combinations
of
resistors
R
197
t h
roug
h
R216
.
In
or
d
er
to
obtain
calibrate
d cu
rrent
ste
p
s,
t
he
voltage
across
t
he cu
rrent
setting
resistors
must
be h
el
d
at
1
volt
p
er
ste
p
.
T
h
e voltage
at
t
h
e
out
p
ut,
h
owever,
may
vary
by
t
h
e
amo
u
nt
of
t
h
e
turn-on
voltage of
t
he device und
er test
and
alter
t
he
current
p
er
ste
p
out
put of
t
he
ste
p
generator
.
To
com
p
ensate
for
t
h
is
turn-on
voltage,
any
variation
from
groun
d of
voltage
at
t
he
in
p
ut to
t
he d
evice
und
er
test
is
transmitte
d
t
h
roug
h
t
h
e
+1
am
p
lifier
to
t
h
e
p
ositive
si
de of
t
he d
ifferential
am
p
lifier
.
T
h
is
starts
α
regulating
p
rocess
w
h
ic
h
causes
t h
e
voltage
at
t
he
in
p
ut
to
t
he c
u
rrent
setting
resistors
to
move
in t
he
same
d
irection
as
t
he
turn-on
volt-
age
at
t
h
e
out
p
ut, t h
us
nullifying
its
effect
.
T
h
e
+1
am
p
lifier
is
ma
de
up
of
p
ara
p
h
ase
am
p
lifier
Q229A
an
d
Β
,
constant
current
sources
Q233
and
Q226,
an
d
emitter
followers
Q235
an
d
Ο
241
.
In
t
he c
u
rrent
mo
d
e,
a
n
y
voltage
at
t
h
e
in
p
ut of
t
h
e
d
evice
un
d
er test
is
trans-
mitted
t
h
roug
h
8220
to
t
h
e h
ig
h im p
e
d
ance
gate
in
put to
0229
Β
.
If,
for
exam
p
le,
t
h
is
variation
is
α
rise
in
voltage
at
t
he gate
i
n
p
ut,
it
will
be
accom
p
anie
d
by
α
rise
in
voltage
at
t
he
d
rain
of
Q229A,
d
ue
to
t
he para
p
h
ase
op
eration of
Q229A
an
d
Β
.
Raising
t h
e voltage
at
t
he
Q226A
d
rain raises
t
h
e
base
of
emitter follower
Q235,
an
d
t
hus
t
h
e
base
of
emitter follower
Q241
.
As
t
he emitter
of
0241
follows
its
base
up,
it
p
ulls
t
h
e
voltage
at
t
he gate of
Q266A
up
so
t
h
at
it is
eq
u
al
to
t
h
e voltage
at
t
he gate of
Q266
B
.
T
h
is
rise
in
voltage
at
t
h
e
gate of
Q266A
is
t
h
en
transmitte
d to
t
he base
of
Q150
B
(
p
ositive
si
d
e
of
t
h
e
d
ifferential
am
p
lifier)
t
h
roug
h
feedbac
k
resistors
R243
and
R244
.
T
he +1
am
p
li-
fier,
t
h
erefore,
transmits
any
voltage
variation
from
t
h
e
in-
p
ut
to
t
he
d
evice
un
d
er test
to
t
he
in
p
ut to
t
h
e base of
Q150
B
with
no
ch
a
nge
in
am
p
litu
de or
p
olarity
.
In
p
er-
forming
t
h
is
tas
k
,
t
h
e
+1
am
p
lifier
provides
t h
e voltage
vari-
ation with α h
ig
h
im
p
e
d
ance
in
p
ut
an
d
α
low
im
ped
ance
out
pu
t
.
Wh
en
t
h
e
rise
in
voltage
at
t
he base of
Q150
B
h
as
been
transmitted
to
t
he
in
p
ut
to
t
he
curren
t
setting
resis-
tors,
it
com
pensates for voltage
variations
at
t
h
e in
p
ut to
t
he d
evice
un
d
er test
h
ol
d
ing
t
he voltage
across
t
h
e
c
u
rrent
setting
resistors
at
1
volt
per
ste
p
.
AMP
BA
L R224
a
d
ju
sts
t
h
e
DC
balance
of
p
a
r
aph
ase
amplifier
0229,
and
also
com
p
ensates
for
unbalance
in
0150
.
O
U
T
PU
T
Ζ
ad
j
ustme
n
t
R243
ad
j
usts
t
he
out
p
ut
im
pe
d
ance
of
t
he
ste
p
am
p
l
if
ier
.
Relay
Κ
101
Β
an
d
Q248
or
Q250
are
used
to
limit
t
he
voltage
w
h
ic
h
may
be
a
pp
lie
d to α device und
er test
in t
he
reverse
d
irection
using
o
pposing
offset
.
If,
for
exam
p
le,
Ci
r
cuit
Desc
r
iption-Ty
p
e
576
p
ositive
going
ste
p
s
are
to
be
a
pp
lie
d to
t
h
e
d
evice
u
n
d
er
test,
Κ
101
Β
is
in t
he
+
p
osition
.
If
negative
offset
is
a
pp
lie
d
to
t
he device
un
d
er test
by
pus
h
ing
t
he
O
PP
OS
E
butto
n
and turn
i
ng
t
he
O
FF
S
ET
MUL
T
control
clock
wise,
t
h
e
step
generator
will
attem
p
t
to
con
duct
negative
current
at
t
he
in
p
ut to
t
he d
evice
u
n
der
test
.
I
n d
oing
t
h
is,
t
h
e voltage
at
t
he
in
p
ut
an
d
t
hu
s t h
e voltage
at
t
h
e
Q229
B
gate
input
is
d
riven
d
ow
n
.
Wh
en
t
he voltage
goes
app
roximately
2
volts
below
groun
d
,
Q248
turns
on
.
Wit
h
Q248
on,
t
he
n
egative-
going
voltage
ste
p
s
at
t
he base of
0150
Α
are limite
d
,
t
hu
s
limiti
n
g t
he
out
p
u
t
of
t
he
out
p
ut
am
p
lifier (t
he
in
put to
t
he
d
evice
un
d
er
test)
to
about
2
volts
.
T
h
is
amount
of
voltage
s
houl
d
not
d
amage
α device
un
d
er test
.
V
oltage
M
o
d
e
.
V
oltage
ste
p
s
are
obtaine
d
from
t
he ou
t-
p
ut
am
p
lifier in
α
manner
similar
to
t
h
at
use
d to
obtain
current
ste
p
s
.
F
or voltage
ste
p
s,
h
owever,
t
he
VO
L
TAG
E
S E
TTI
NG
RE
SISTO
RS are
c
h
ange
d
to
obtain
t
he
vario
u
s
voltage
am
p
litu
d
es,
rat
h
er
t
h
an
t
he
C
URREN
T
S E
TTI
N
G
RE
SISTO
R
S
(w
h
ic
h
are
h
el
d
constant
in
t
he voltage
mo
d
e)
.
Also
since
it is
not
desirable
to
regulate
t
h
e
voltage
at
t h e
input
to
t
h
e
C
URREN
T
S
E
TTI
NG
RESISTORS
in
t
he
volt-
age
mo
d
e, t
he
fee
d
bac
k
to
t
h
e
p
ositive
si
de of
t
h
e
d
ifferen-
tial
am
p
lifier t
h
roug
h
t
he +1
am
p
lifier
is
d
isconnecte
d
an
d
t
he
in
pu
t
to
t
h
e +1
am
p
lifier is
connecte
d to
groun
d
.
T
h
e
base of
0150
Β
is,
t h
erefore,
h
el
d
at
essentially
groun
d
.
Since
t
he
out
p
u t
of
t h
e +1
am
p
lifier
is
at
groun
d
,
reverse
voltage
limiting
transistors
Q248
an
d
Q250
are
d
isable
d
in
t
he voltage
mo
de
.
In
t
he voltage
mo
de
w
h
en
ste
p
s
of 1/2
volt
p
er
ste
p
are
ap
p
lie
d
to
t
he
ste
p
out
put
am
p
lifier,
t
hey
are
transmitte
d
t
h
roug
h
V
O
L
TAG
E
S
E
TTI
NG
RE
SISTA
N
C E
R
141
t
h
roug
h
R145,
t
he
in
p
u
t
resistance
.
By
varying
t
h
is
in
pu
t
resistance
with
res
p
ect
to
constant
fee
d
bac
k
resistance
R194,
t
he
fee
d
bac
k
gain
of
t
h
e
negative
si
d
e
of
t
h
e
d
iffer-
ential
am
p
lifier
is
ch
ange
d
, t
hus
varyi
ng
t
he
am
p
litu
de of
t h e
voltage
ste
p
s
.
After
being
con
d
ucte
d
t
h
roug
h
t
h
e
volt-
age
setting
resistors,
t
h
e
steps
are
am
p
lifie
d and
transmitted
t h
roug
h
t
h
e
negative
si
d
e
of
t
he d
ifferential
am
p
lifier
in
t
he
same
manner
as
d
escribed
in
t
he current
mo
d
e
section
.
Wh
en
t
he voltage
ste
p
s
reac
h
t
he
C
URREN
T
S
E
TTI
N
G
RE
SISTO
R
S,
t
hey are
transmitte
d
t
h
roug
h α
nominal
resis-
tance
(
R
215and
8216)
of 5
Ω
,
for
all
voltage p
ositions
of
t
he
A
MPL
IT
U
D
E
switch
,
before being
a
pp
lie
d
to
t
he d
evice
under
test
.
V
oltage
ste
p
s
of
varying
am
p
litu
d
es,
as
d
eter-
mine
d
by
t
he
A
MPL
IT
UD
E
switc
h
,
are
t
hen
develope
d
across
t
h
e
in
p
ut
im
p
ed
ance
of
t
he d
evice
un
der
test
.
F
eed-
bac
k to
t
he
in
p
ut
to
t
he d
ifferential
am
p
lifier
occurs
at
t
h
e
out
put of
t h e
current
setting
resistors,
t h
erefore,
mini-
mizing
t
h
e
effect
of
R215
and
8216
.
Wh
en
using
voltage
ste
p
s,
t
he current
con
d
ucted
at
t
he
step
generator
in
put
to
t
h
e
d
evice
un
d
er test
may
increase
q
uite
ra
p
i
d
ly
a
n
d
p
ossibly
d
amage
t
h
e
d
evice
un
d
er test
(es
p
ecially
w
h
en
testi
n
g
transistors)
.
As
α
means
of
limiting
t
h
is
current
in
t
he voltage
mo
d
e, c
u
rrent
limiting
resistors
R
185,
R
186
an
d R
187
are added to
t
h
e
output
am
p
lifier
circ
u
it
by
t
he
AM
PL
IT
U
D
E switch
.
T
h
ese
resistors
limit
current
at
t
he Ste
p
Generator
O
u
t
put
by
limiting
current
3-
1
3

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