1. Check the blocking of the echo with the injection of a CRL signal >40ms after a reverse fault is
applied.
2. Measure the duration of the echoed CS signal by applying a CRL receive signal.
3. Check the trip functions and the voltage level for trip by reducing a phase voltage and applying
a CRL receive signal.
Testing conditions
M14947-52 v7
Only one type of fault is sufficient, with the current reversal and weak-end infeed logic for distance
protection function ZCRWPSCH. Apply three faults (one in each phase). For phase L1-N fault, set
these parameters:
Table 40: Phase L1-N parameter values
Phase I (Amps) Phase-angle
(Deg)
V (Volts) Phase-angle
(Deg)
L1 0 0 Set less than UPN< 0
L2 0 240 63 240
L3 0 120 63 120
If wanted, change all settings cyclically for other faults (L2-N and L3-N).
The setting parameter WEI is set to Echo & Trip.
1. Apply input signals according Table 40.
2. Activate the receive (CR) signal.
3. After the IED has operated, turn off the input signals.
4. Check that trip, send signal, and indication are obtained.
The ECHO output gives only a 200 ms pulse.
11.12.3.4 Completing the test
M14947-105 v5
Continue to test another function or end the test by changing the TESTMODE setting to Off. Restore
connections and settings to the original values, if changed for testing purposes.
11.12.4 Scheme communication logic for residual overcurrent
protection ECPSCH
M13926-2 v6
Prepare the IED for verification of settings outlined in Section "Preparing the IED to verify settings".
Before testing the communication logic for residual overcurrent protection function ECPSCH, the four
step residual overcurrent protection function EF4PTOC has to be tested according to the
corresponding instruction. Once this is done, continue with the instructions below.
If the current reversal and weak-end infeed logic for earth-fault protection is included, proceed with
the testing according to the corresponding instruction after testing the communication logic for
residual overcurrent protection. The current reversal and weak-end-infeed functions shall be tested
together with the permissive scheme.
1MRK 504 165-UEN Rev. K Section 11
Testing functionality by secondary injection
Transformer protection RET670 255
Commissioning manual
© 2017 - 2022 Hitachi Energy. All rights reserved
To Next Page
Loading...