high
dynamic range
swept RF/IF
conversion
loss,
3-12
high-stability
frequency reference(10
MHz)
(option
001), 7-34
high
stability frequency
reference
option,
1-12
Hld
status
notation,
1-8
hold
mode
,
test
set
switch,
5-54
how
to
abort
a
print
or
plot
process,
4-30
activate
a
xed
marker,
2-11
activate
chop
sweep
mode,
5-54
activate
display
markers,
2-10
calculate
data
statistics,
2-26
calibrate
the
analyzer
receiver
to
measure
absolute
power,
5-38
change
measurement
averaging,
5-56
change
system
bandwidth,
5-56
change
the
sequence
title,
2-58
clean
connectors,
2-2
clear
a
sequence
from
memory,
2-57
compensate
for
directional
coupler
response,
5-35
congure
a
plot
function,
4-8
congure
a
plot
function
to
disk drive,
4-11
congure
a
plot
function
using
and
HPGL/2
compatible printer,
4-8
congure
aplot
function
using
a
pen
plotter,
4-10,
11-11
congure
a print
function, 4-3
construct
aloop
structure in
a
sequence,
2-62
control
the
test
set
switch,
5-54
couple
and
uncouple
display
markers,
2-14
create
a
limit
test
sequence,
2-64
create
a
test
sequence,
2-54
create
at
limit
lines,
2-37
create
single
point
limits,
2-41
create
sloping
limit
lines,
2-39
decrease frequency span, 5-50
dene line types, 4-14
dene the plot, 4-12
dene the print, 4-5
delete all instrument state les, 4-41
delete an instrument state, 4-41
delete a single instrument state le, 4-41
delete limit segments, 2-42
divide measurement data by the memory
trace, 2-7
edit a sequence, 2-56
edit limit segments, 2-42
edit power calibration factors, 5-34
enter the power sensor calibration data,
5-34
error-correct
for frequency
response, 5-8
error-correct
for frequency
response
and
isolation,
5-13
error-correct
for full
two-port
measurements,
5-20
error-correct
for one-port
reection
measurements,
5-17
error-correct
for
response
and
isolation
for
reection
measurements,
5-13
error-correct
for
response
and
isolation
for
transmission
measurements,
5-15
error-correct
for
TRL*,
5-23
error-correct
for
TRM*,
5-23
error-correct
measurements,
5-7
error-correct
response
for
reection
measurements,
5-8
error-correct
response
for
transmission
measurements,
5-10
format
a
disk,
4-43
gate
out
responses,
2-70
increase
sweep
speed,
5-50
insert
a
sequence
command,
2-56
load
a
sequence
from
disk,
2-60
make
a
basic
measurement,
2-3
make
accurate
measurements
of
electrically
long
devices,
5-48
measure
conversion
loss
using
tuned
receiver mode,
3-17
measure
deviation from
linear
phase,
2-32
measure
devices using
the
time
domain,
2-68
measure
electrical length
and phase
distortion,
2-30
measure
xed
IF
mixers,
3-17
measure
gain
compression,
2-45
measure
group
delay,
2-33
measure
group
delay
or
phase
for
mixers,
3-24
measure
high
dynamic
range
conversion
loss,
3-12
measure magnitude and insertion phase
response, 2-27
measure mixer isolation, 3-33
measure mixer LO to RF isolation, 3-33
measure mixers, 3-1
measure reection response in time domain,
2-73
measure reverse isolation and gain, 2-49
measure swept harmonics, 2-66
measure swept RF/IF mixers, 3-7
measure transmission response in time
domain, 2-68
modify a sequence command, 2-57
modify calibration standards, 5-26
modify TRL calibration standards, 5-28
Index-9