8086
ABSOLUTE MAXIMUM RATINGS*
Ambient Temperature Under Bias ÀÀÀÀÀÀ0
§
Cto70
§
C
Storage Temperature ÀÀÀÀÀÀÀÀÀÀ
b
65
§
Cto
a
150
§
C
Voltage on Any Pin with
Respect to GroundÀÀÀÀÀÀÀÀÀÀÀÀÀÀ
b
1.0V to
a
7V
Power DissipationÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀÀ2.5W
NOTICE: This is a production data sheet. The specifi-
cations are subject to change without notice.
*
WARNING: Stressing the device beyond the ‘‘Absolute
Maximum Ratings’’ may cause permanent damage.
These are stress ratings only. Operation beyond the
‘‘Operating Conditions’’ is not recommended and ex-
tended exposure beyond the ‘‘Operating Conditions’’
may affect device reliability.
D.C. CHARACTERISTICS (8086: T
A
e
0
§
Cto70
§
C, V
CC
e
5V
g
10%)
(8086-1: T
A
e
0
§
Cto70
§
C, V
CC
e
5V
g
5%)
(8086-2: T
A
e
0
§
Cto70
§
C, V
CC
e
5V
g
5%)
Symbol Parameter Min Max Units Test Conditions
V
IL
Input Low Voltage
b
0.5
a
0.8 V (Note 1)
V
IH
Input High Voltage 2.0 V
CC
a
0.5 V (Notes 1, 2)
V
OL
Output Low Voltage 0.45 V I
OL
e
2.5 mA
V
OH
Output High Voltage 2.4 V I
OH
eb
400 mA
I
CC
Power Supply Current: 8086 340
8086-1 360 mA T
A
e
25
§
C
8086-2 350
I
LI
Input Leakage Current
g
10 mA0V
s
V
IN
s
V
CC
(Note 3)
I
LO
Output Leakage Current
g
10 mA 0.45V
s
V
OUT
s
V
CC
V
CL
Clock Input Low Voltage
b
0.5
a
0.6 V
V
CH
Clock Input High Voltage 3.9 V
CC
a
1.0 V
C
IN
Capacitance of Input Buffer 15 pF fc
e
1 MHz
(All input except
AD
0
–AD
15
,RQ/GT)
C
IO
Capacitance of I/O Buffer 15 pF fc
e
1 MHz
(AD
0
–AD
15
,RQ/GT)
NOTES:
1. V
IL
tested with MN/MX Pin
e
0V. V
IH
tested with MN/MX Pin
e
5V. MN/MX Pin is a Strap Pin.
2. Not applicable to RQ
/GT0 and RQ/GT1 (Pins 30 and 31).
3. HOLD and HLDA I
LI
min
e
30 mA, max
e
500 mA.
14
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