optris PI 400i - Characteristic Emissivity

Emissivity 83-
8.3 Characteristic emissivity
In case none of the methods mentioned above help to determine the emissivity you may use the emissivity
table ► Appendix A and Appendix B. These are average values, only. The actual emissivity of a material
depends on the following factors:
 temperature
 measuring angle
 geometry of the surface
 thickness of the material
 constitution of the surface (polished, oxidized, rough, sandblast)
 spectral range of the measurement
 transmissivity (e.g. with thin films)
Figure 51: Adjustment of the emissivity in the software PIX Connect (menu Tools/ Configuration/ Device)