R&S ZNA26 - Page 5

Contents
R&S
®
ZNA
5User Manual 1178.6462.02 ─ 20
4.3.8 Delay, aperture, electrical length.................................................................................140
4.4 Operations on traces................................................................................................ 141
4.4.1 Limit check.................................................................................................................. 141
4.4.2 Trace files....................................................................................................................149
4.5 Calibration................................................................................................................. 158
4.5.1 Calibration types......................................................................................................... 160
4.5.2 Calibration standards and calibration kits................................................................... 172
4.5.3 Calibration pool........................................................................................................... 178
4.5.4 Calibration labels.........................................................................................................178
4.5.5 Automatic calibration...................................................................................................179
4.5.6 Scalar power calibration..............................................................................................191
4.5.7 SMARTerCal................................................................................................................197
4.5.8 Parallel calibration of multiple channels...................................................................... 200
4.5.9 Joining calibrations......................................................................................................200
4.6 Offset parameters and de-/embedding................................................................... 201
4.6.1 Offset parameters........................................................................................................201
4.6.2 Embedding and deembedding.................................................................................... 207
4.7 Optional extensions and accessories.....................................................................219
4.7.1 Spectrum analyzer mode............................................................................................ 220
4.7.2 Time domain analysis..................................................................................................220
4.7.3 Frequency conversion measurements........................................................................ 234
4.7.4 Phase coherent source control................................................................................... 247
4.7.5 True differential mode................................................................................................. 248
4.7.6 Pulsed measurements................................................................................................ 251
4.7.7 Millimeter-wave converter support.............................................................................. 253
4.7.8 Increased IF bandwidth 30 MHz................................................................................. 259
4.7.9 Frequency resolution 1 mHz....................................................................................... 259
4.7.10 Continuous data recording.......................................................................................... 259
4.7.11 Noise figure measurement..........................................................................................260
4.7.12 Measurement uncertainty analysis..............................................................................265
4.7.13 Security write protection..............................................................................................267
4.7.14 Eazy de-embedding based on IEEE 370.................................................................... 268
4.7.15 In-situ de-embedding.................................................................................................. 270