Tektronix TDS 520B Programming Manual

Index
Index–6
TDS Family Oscilloscope Programmer Manual
MATH<x>:DEFINE, 2–166
MATH<x>:NUMAVg, 2–168
MATH<x>:PROCessing, 2–169
MATH<x>, command mnemonic, 2–7
Measurement command group, 2–19
Measurement commands
MEASUREMENT?, 2–170
MEASUREMENT:CLEARSNAPSHOT, 2–170
MEASUREMENT:GATING, 2–171
MEASUREMENT:IMMED?, 2–171
MEASUREMENT:IMMED:DELAY?, 2–172
MEASUREMENT:IMMED:DELAY:DIRECTION,
2–172
MEASUREMENT:IMMED:DELAY:EDGE1, 2–173
MEASUREMENT:IMMED:DELAY:EDGE2, 2–174
MEASUREMENT:IMMED:SOURCE1, 2–175
MEASUREMENT:IMMED:SOURCE2, 2–176
MEASUREMENT:IMMED:TYPE, 2–176
MEASUREMENT:IMMED:UNITS?, 2–179
MEASUREMENT:IMMED:VALUE?, 2–179
MEASUREMENT:MEAS<x>?, 2–180
MEASUREMENT:MEAS<x>: DELAY?, 2–180
MEASUREMENT:MEAS<x>: DELAY:
DIRECTION?, 2–180
MEASUREMENT:MEAS<x>: DELAY:EDGE1,
2–181
MEASUREMENT:MEAS<x>: DELAY:EDGE2,
2–182
MEASUREMENT:MEAS<x>: DELAY:SOURCE1,
2–183
MEASUREMENT:MEAS<x>: DELAY:SOURCE2,
2–184
MEASUREMENT:MEAS<x>: STATE, 2–184
MEASUREMENT:MEAS<x>: TYPE, 2–185
MEASUREMENT:MEAS<x>: UNITS?, 2–188
MEASUREMENT:MEAS<x>: VALUES?, 2–188
MEASUREMENT:METHOD, 2–189
MEASUREMENT:REFLEVEL?, 2–189
MEASUREMENT:REFLEVEL:
ABSOLUTE:HIGH, 2–190
MEASUREMENT:REFLEVEL: ABSOLUTE:MID,
2–191
MEASUREMENT:REFLEVEL:
ABSOLUTE:MID2, 2–192
MEASUREMENT:REFLEVEL: METHOD, 2–192
MEASUREMENT:REFLEVEL: PERCENT:HIGH,
2–193
MEASUREMENT:REFLEVEL: PERCENT:LOW,
2–194
MEASUREMENT:REFLEVEL: PERCENT:MID,
2–194
MEASUREMENT:REFLEVEL: PERCENT:MID2,
2–195
MEASUREMENT:REFLEVEL:ABSOLUTE:LOW,
2–190
MEASUREMENT:SNAPSHOT, 2–196
Measurement specifier, command mnemonic, 2–6
MEASUREMENT?, 2–170
MEASUREMENT:CLEARSNAPSHOT, 2–170
MEASUREMENT:GATING, 2–171
MEASUREMENT:IMMED?, 2–171
MEASUREMENT:IMMED:DELAY?, 2–172
MEASUREMENT:IMMED:DELAY:DIRECTION,
2–172
MEASUREMENT:IMMED:DELAY:EDGE1, 2–173
MEASUREMENT:IMMED:DELAY:EDGE2, 2–174
MEASUREMENT:IMMED:SOURCE1, 2–175
MEASUREMENT:IMMED:SOURCE2, 2–176
MEASUREMENT:IMMED:TYPE, 2–176
MEASUREMENT:IMMED:UNITS?, 2–179
MEASUREMENT:IMMED:VALUE?, 2–179
MEASUREMENT:MEAS<x>?, 2–180
MEASUREMENT:MEAS<x>: DELAY?, 2–180
MEASUREMENT:MEAS<x>: DELAY:DIRECTION?,
2–180
MEASUREMENT:MEAS<x>: DELAY:EDGE1, 2–181
MEASUREMENT:MEAS<x>: DELAY:EDGE2, 2–182
MEASUREMENT:MEAS<x>: DELAY:SOURCE1,
2–183
MEASUREMENT:MEAS<x>: DELAY:SOURCE2,
2–184
MEASUREMENT:MEAS<x>: STATE, 2–184
MEASUREMENT:MEAS<x>: TYPE, 2–185
MEASUREMENT:MEAS<x>: UNITS?, 2–188
MEASUREMENT:MEAS<x>: VALUES?, 2–188
MEASUREMENT:METHOD, 2–189
MEASUREMENT:REFLEVEL?, 2–189
MEASUREMENT:REFLEVEL:ABSOLUTE:HIGH,
2–190
MEASUREMENT:REFLEVEL:ABSOLUTE:LOW,
2–190
MEASUREMENT:REFLEVEL:ABSOLUTE:MID,
2–191
MEASUREMENT:REFLEVEL:ABSOLUTE:MID2,
2–192
MEASUREMENT:REFLEVEL:METHOD, 2–192
MEASUREMENT:REFLEVEL:PERCENT:HIGH,
2–193
MEASUREMENT:REFLEVEL:PERCENT:LOW,
2–194
MEASUREMENT:REFLEVEL:PERCENT:MID,
2–194

Tektronix TDS 520B Specifications

General

Brand	Tektronix
Model	TDS 520B
Category	Test Equipment
Language	English