Copyright © 2016, Texas Instruments Incorporated
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mP
TPA3116D2
SDZ
MUTE
FAULTZ
SDZ
MUTE
FAULTZ
18
TPA3116D2
,
TPA3118D2
,
TPA3130D2
SLOS708G –APRIL 2012–REVISED DECEMBER 2017
www.ti.com
Product Folder Links: TPA3116D2 TPA3118D2 TPA3130D2
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Figure 30. MUTE Driven by Inverted FAULTZ Figure 31. Timing Requirement for SDZ
7.3.11 Thermal Protection
Thermal protection on the TPA31xxD2 family prevents damage to the device when the internal die temperature
exceeds 150°C. There is a ±15°C tolerance on this trip point from device to device. Once the die temperature
exceeds the thermal trip point, the device enters into the shutdown state and the outputs are disabled. This is a
latched fault.
Thermal protection faults are reported on the FAULTZ terminal as a low state.
If automatic recovery from the thermal protection latch is desired, connect the FAULTZ pin directly to the SDZ
pin. This allows the FAULTZ pin function to automatically drive the SDZ pin low which clears the thermal
protection latch.
7.3.12 Device Modulation Scheme
The TPA31xxD2 family has the option of running in either BD modulation or 1SPW modulation; this is set by the
MODSEL pin.
7.3.12.1 MODSEL = GND: BD-Modulation
This is a modulation scheme that allows operation without the classic LC reconstruction filter when the amp is
driving an inductive load with short speaker wires. Each output is switching from 0 volts to the supply voltage.
The OUTPx and OUTNx are in phase with each other with no input so that there is little or no current in the
speaker. The duty cycle of OUTPx is greater than 50% and OUTNx is less than 50% for positive output voltages.
The duty cycle of OUTPx is less than 50% and OUTNx is greater than 50% for negative output voltages. The
voltage across the load sits at 0V throughout most of the switching period, reducing the switching current, which
reduces any I
2
R losses in the load.
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