Toshiba Satellite L510 Series - FN Key Combinations and Hot Keys

3.6MemoryTest 3DiagnosticPrograms
 

 
    
 

 
37
testcoveragewouldbebasedonthesettingandthevaluein‘Percent(%)
mentionedatbelow.
PatternSize:Choosethepatternsize–BYTE,WORD,DWORDorALL.
Percent(%):Choosethepercentageofthedefinedrangeofthememoryto
betested.
TimeLimit(h):ChooseorInputthetime(hour)ofthedefinedrangeofthe
memorytobetested.
TimeLimit(m):ChooseorInputthetime(minute)ofthedefinedrangeof
thememorytobetested.
1. BitStuckHighTest
Datapattern:Everybitis‘1’(Eachbitishigh)
2. BitStuckLowTest
Datapattern:Everybitis‘0'(Eachbitislow);
3. CheckerBoardTest
Datapattern:Lo-byteandhi-bytearecomposedwith0101(0x5)and1010
(0xA);
4. CASLineTest
Datapattern:Lo-byteandhi-bytearecomposedwith0000(0x0)and
1111(0xF);
5. IncrementalTest
Datapattern:Aseriesofincreasingdatafrom0byadding1eachtime;
6. DecrementTest
DataPattern:Aseriesofdecreasingdatafromthemaximum(e.g.0xFFFF)by
subtracting1eachtime;
7. Incremental/DecrementTest
DataPatternisaseriesofdatawhoselowbyteisincreasingdatafrom0x00
andhighbyteisdecreasingdatafrom0xFF.
Subtest04 ExtendedPattern