Veeco 004-210-100 User Manual (English)

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Veeco 004-210-100 Specifications

General

Brand	Veeco
Model	004-210-100
Category	Microscope
Language	English

Summary

Introduction to the Digital Instruments MultiMode SPM

1.1 Introduction

Introduces the MultiMode SPM, its capabilities, and software architecture.

1.2 Safety

Covers general safety precautions and rules for operating the MM-SPM.

1.2.1 Six Rules of Safety

Summarizes key safety rules for new users.

1.2.2 Safety Requirements

Details safety symbols and their meanings.

1.2.3 Safety Precautions

Provides general operator safety guidelines and warnings.

SPM Fundamentals for the MultiMode

2.1 Hardware

2.2 Control Mechanisms and Feedback

Explains the electronic feedback loop for controlling tip-sample interaction.

2.3 Feedback Gains

2.3.6 Setpoint

2.3.7 The SPM Electronic Feedback Loop

2.5 Review of TappingMode AFM

2.5.1 General Operating Concepts

2.5.2 Optimizing the TappingMode AFM Signal after Engagement

Provides rules and steps for optimizing TappingMode signals.

Setup & Installation

3.1 Installing the MultiMode SPM

Guides on setting up the computer, controller, and monitors for the SPM.

3.2 Component List

Lists all necessary components included with the MultiMode SPM system.

3.2.1 Unpack The System

3.2.2 Vibration Isolation

Explains the importance of isolating the microscope from vibrations and methods to achieve it.

3.2.3 System Power Up

Details the procedure for powering up the system components in the correct sequence.

Cantilever Preparation

4.1 Silicon Cantilever Substrates

Describes how to handle and prepare silicon cantilever substrates from wafers.

4.2 Silicon Nitride Cantilever Substrates

Details how to handle and prepare silicon nitride cantilever substrates from wafers.

Head, Probe and Sample Preparation

5.1 Initial Preparation for Contact AFM Imaging

Guides on preparing the sample for contact AFM imaging.

5.1.1 Prepare the Sample

Instructions for placing and securing the sample onto the scanner.

5.1.2 Load the Sample

5.1.3 Load Probe in Tipholder

Explains how to install a probe tip into the AFM tipholder.

5.1.4 Install the Tipholder

Guides on placing and securing the loaded tipholder into the SPM head.

5.2 Laser Alignment

Describes methods for aligning the laser beam with the cantilever and tip.

5.2.1 Method 1: OMV Method

5.2.2 Method 2: The Projection Method

5.2.3 Maximize the SUM Signal

5.3 Start the Microscope Program

Contact AFM Mode

6.1 Preparation Prior to Imaging

Details pre-imaging steps, including detector offset adjustments.

6.1.1 Adjust the Detector Offsets

Guides on adjusting photodetector mirror knobs for laser spot alignment.

6.1.2 Signal Settings

6.1.3 Adjust tip height above sample surface

Explains how to adjust the tip height for initial contact with the sample.

6.2 Suggested Initial Control Settings

Provides recommended initial settings for Scan Controls and Feedback Controls.

6.2.2 Initial Scan Parameter Settings

6.3 Initiate the Engage Command

Guides on initiating the engage process for tip-sample contact.

6.3.1 Adjust Setpoint with Force Calibration

Describes how to use Force Calibration to minimize setpoint and contact force.

6.5 Optimization of Scanning Parameters

6.5.2 Gain settings

6.5.4 Setpoint

TappingMode AFM

7.1 Basic Principle of TappingMode

Explains the fundamental principles of TappingMode AFM operation.

7.2 Preparation Prior to Imaging

Details steps for preparing the system for TappingMode imaging.

7.2.1 Switch to TappingMode

7.2.3 Check Parameters

7.2.4 Adjust Laser and Photodetector

Guides on adjusting the laser and photodetector for optimal TappingMode operation.

7.2.6 Tune the Cantilever

Details the process of finding the cantilever's resonant frequency and adjusting amplitude.

7.2.7 Setting the Drive Amplitude and Setpoint

Explains how to set drive amplitude and setpoint for TappingMode.

7.3 Engaging The Microscope

Guides on engaging the tip with the sample for TappingMode imaging.

7.4 Withdrawing the Tip

7.5.2 Tuning the Cantilever Drive Frequency

Details how to tune the cantilever drive frequency for optimal performance.

7.5.3 Optimization of Scanning Parameters

Fluid Operation

8.1 Introduction

8.2 General Fluid Operation

Explains the components and general procedures for fluid imaging.

8.2.1 Clean Fluid Cell and O-ring

Provides instructions for cleaning the fluid cell and O-ring to prevent contamination.

8.2.3 Remove Organic Contamination from the Tip

8.2.4 Load the Fluid Cell with a Probe

Details the procedure for loading a probe into the fluid cell.

8.2.5 Sample Mounting

Guides on securing a sample support to the sample puck.

8.2.6 Align the Laser

8.2.7 Adjust the Detector Offsets and Setpoint (Contact Mode)

Guides on adjusting detector offsets and setpoint for contact mode fluid imaging.

8.2.8 Engage the Surface

Details the process of engaging the tip with the sample surface in fluid.

8.2.9 Adjust Scan Parameters (Contact Mode)

8.2.10 Clean and Dry Parts When Done

8.3 TappingMode in Fluids

Covers operating TappingMode AFM in fluid for imaging samples.

8.3.1 Procedure for TappingMode Imaging in Fluid

Provides a procedure for TappingMode imaging in fluid.

8.3.2 Plotting Amplitude vs. Distance (Force Cal Curve)

Explains how to plot amplitude vs. distance for force calibration.

8.3.3 Optimizing Image Quality

Guides on adjusting setpoint and other parameters for optimal image quality.

8.4 Troubleshooting Tips

Lists common problems and solutions for fluid imaging.

8.4.1 Cantilever Tune Plot Looks Poor: Loose Probetip

Addresses issues with cantilever tune plots indicating a loose probetip.

8.4.2 Laser Sum Signal Absent or Weak: Air Bubbles

Troubleshoots issues with laser sum signal due to air bubbles.

8.4.3 Poor Image Quality

Discusses causes of poor image quality, including contaminated tips.

Scanning Tunneling Microscopy (STM)

9.1 STM Introduction

Introduces STM principles, capabilities, and hardware.

9.1.1 Overview of STM

9.1.2 STM Hardware

9.1.4 Vibration isolation

9.2 Basic STM Operation

Guides on setting up the NanoScope for STM imaging.

9.2.1 System Setup

Details the steps for setting up the system for STM operation.

9.3 Spectroscopy with the STM

9.4 Troubleshooting for STM

Addresses common errors and malfunctions encountered during STM operation.

9.4.1 Head and Microscope-related Problems

Lists troubleshooting tips for head and microscope issues in STM.

9.5 Low-Current STM

Introduces low-current STM operations and requirements.

9.5.1 Description

9.5.3 Precautions

Highlights special precautions due to the sensitive electronic components of low-current STM.

9.5.4 Installation

Guides on installing the low-current STM converter.

9.5.5 Operation

9.5.6 Servicing the Converter

9.6 Etching Tungsten Tips

Lateral Force Mode

10.1 Basic LFM Operation

Guides on setting up and running the system for basic LFM imaging.

10.2 Advanced LFM Operation

Force Imaging

11.2 Force Calibration Mode

Introduces Force Calibration mode for checking tip-sample interaction.

11.2.2 Contact AFM Force Plots

11.3 Force Calibration Control Panels and Menus

11.3.4 Feedback Controls Panel

11.4 Force Calibration (Contact Mode AFM)

Guides on obtaining and interpreting force curves for contact AFM.

11.4.1 Obtaining a Good Force Curve

Provides steps for obtaining a usable force curve in contact AFM.

11.4.2 Helpful Suggestions

Offers tips for troubleshooting common issues like false engagement in force calibration.

11.4.3 Advanced Techniques

11.5 Force Calibration (TappingMode)

Guides on performing force calibration specifically for TappingMode.

11.5.1 Force Plots

Explains the process of collecting force plots in TappingMode.

11.5.2 Obtaining a Force Plot (TappingMode)

Provides steps to generate a TappingMode force plot using a calibration reference.

11.5.3 High Contact Force

Discusses and how to avoid high contact forces during TappingMode force plots.

11.6 Force Modulation

Describes the operation of force modulation mode for imaging elasticity.

11.6.1 Introduction

11.6.2 Selecting a Force Modulation Tip

11.6.4 Force Modulation Procedure

Details the step-by-step procedure for operating in Force Modulation mode.

11.6.5 Notes About Artifacts

11.7 Force Modulation with ‘Negative LiftMode’

Introduces a new force modulation technique using Negative LiftMode.

11.7.1 Set Interleave Controls

11.7.2 Obtain a TappingMode Image

11.7.3 Obtain a Negative LiftMode Force Modulation Image

Guides on obtaining a Negative LiftMode force modulation image.

11.8 Force Volume

Interleave Scanning and LiftMode

12.1 Preface: Interleave Scanning & LiftMode

Introduces Interleave and LiftMode features for simultaneous data acquisition.

12.2 Interleave Mode Description

12.3 Lift Mode Description

12.4 Operation of Interleave Scanning / Lift Mode

12.5 Use of LiftMode with TappingMode

12.5.3 Interleave Drive Amplitude and Frequency Selection

Magnetic Force (MFM) Imaging

13.1 Magnetic Force Imaging Theory

13.2 MFM Using Interleave Scanning and LiftMode

Provides instructions for obtaining MFM images using Interleave and LiftMode.

13.2.1 Procedure

Details the procedure for obtaining MFM images, including probe mounting and setup.

13.2.2 Frequency Modulation

13.3 Installation of the Extender Electronics Modules

13.3.1 Basic Extender

13.3.2 Quadrex Extender

13.4 Software Setup Configuration (Basic, Quadrex or NSIV)

13.5 Troubleshooting Suggestions

Provides suggestions for troubleshooting common MFM imaging issues.

13.5.1 MFM Image Verification

13.5.2 Saturation in Amplitude Detection

13.5.3 Optical Interference

13.6.2 Fine Tuning Interleave Controls

Electric Force (EFM) Imaging

14.1 Electric Force Microscopy Overview

14.1.1 Electric Field Gradient Imaging Overview

14.1.2 Surface Potential Imaging Overview

14.2 Electric Field Gradient Detection—Theory

14.3 Electric Field Gradient Detection—Preparation

Details preparation steps for EFM, including jumper configurations and voltage application.

14.3.1 Jumper Configurations for systems without the Basic Extender Module

14.3.2 Jumper Configurations for systems with the Basic Extender Module

14.4 Electric Field Gradient Detection—Procedures

Outlines procedures for electric field gradient detection using phase or amplitude detection.

14.4.1 Phase Detection

14.4.2 Amplitude Detection

14.5 Surface Potential Detection—Theory

14.6 Surface Potential Detection—Preparation

Details preparation steps for surface potential detection, including jumper configurations.

14.6.1 Applying Voltage to the Sample Directly

14.6.2 Applying Voltage to the Sample Through Piezo Cap

14.7 Surface Potential Imaging—Procedure

Provides the procedure for performing surface potential imaging.

14.7.1 Troubleshooting the Surface Potential Feedback Loop

Addresses issues with surface potential feedback loop instability and oscillations.

Calibration, Maintenance, Troubleshooting and Warranty

15.1 SPM Calibration Overview

Provides an overview of the software-guided calibration procedure for Veeco SPMs.

15.1.2 Calibration References

15.2 Calibration Setup

15.2.1 Check Scanner Parameter Values

15.2.2 Align Calibration Reference

15.2.3 Set Realtime Parameters

15.2.4 Set Up SPM for Contact AFM

15.3 Check Sample Orthogonality

15.3.1 Measure Orthogonality

15.3.2 Adjust Sample Orthogonality

15.4 Linearity Correction Procedure

Outlines the procedure for optimizing scanner linearity correction parameters.

15.4.1 Adjust Mag0 and Arg

15.4.2 Adjusting Fast Mag1

15.4.3 Adjust Slow Mag1

15.5 X-Y Calibration using Capture Calibration and Autocalibration

Describes X-Y calibration using software routines.

15.5.1 Capture Calibration

Guides on performing Capture Calibration using the NanoScope software.

15.6 Autocalibration

15.7 Fine-tuning for X-Y Calibration

Details fine-tuning procedures for maximum X-Y accuracy.

15.7.1 Prepare System for Fine-Tuning

15.7.2 Measure Horizontally at 440V Scan Size

15.7.3 Measure Vertically at 440V Scan Size

15.7.4 Measure Horizontally at 150V Scan Size

15.7.5 Measure Vertically at 150V Scan Size

15.8 Calibrating Z

Guides on obtaining accurate Z-axis measurements and calibration.

15.8.1 Engage

15.8.2 Capture and Correct an Image

15.8.3 Measure Vertical Features

15.8.4 Correct Z Sensitivity

Explains how to correct the Z sensitivity parameter based on measured pit depth.

15.8.5 Recheck Z-axis Measuring Accuracy

15.8.6 Calculate Retracted and Extended Offset Deratings

15.9 Calibration of “A” Scanners for Atomic-scale Measurement

15.9.1 Prepare Sample

15.10 Quick Guide to Piezo Tube Calibration

15.10.1 Linearize Scanner

15.10.2 Run Autocalibration Software (Factory Operation)

15.10.3 Fine Tune the X-Y Scanner

15.10.4 Calibrate the Z Piezo

15.11 Contact AFM Troubleshooting

Addresses common problems and cures associated with contact AFM.

15.11.1 False engagement

Explains the causes and correction of false engagement in contact AFM.

15.11.2 Head appears engaged but does not track surface features

15.11.3 Head does not engage

15.11.4 Head engages immediately

15.11.6 Lines in the image

15.11.9 Z Center Position goes out of range

15.11.10 Poor image quality

15.11.11 Force Calibration command does not seem to work

15.12 TappingMode AFM Troubleshooting

Lists common problems and cures associated with TappingMode AFM.

15.12.1 Streaks on the trailing edge of surface features

15.12.2 Lines across the image

15.12.3 Rings around features on the surface

15.12.4 Multiple or repeating patterns

15.13 Fluid Imaging Troubleshooting