Agilent Technologies 4284A - Page 29

4-9. Av
ailable Softk
eys on
the CORRECTION
Page
.
4-20
4-10.
Stra
y
Admittance
.
.
.
.
.
.
.
.
. .
. .
. .
4-21
4-11.
OPEN/SHOR
T
Correction Using
The In
terp olation
Metho d
. .
.
.
.
.
.
.
.
.
.
.
.
.
.
. .
4-22
4-12.
Residual
Imp
edance
.
.
.
.
. .
. .
. .
. .
. 4-23
4-13.
OPEN/SHORT/LO
AD Correction
. .
. .
. .
. 4-25
4-14.
CORRECTION
P
age
Example
.
.
.
.
.
.
.
.
.
4-33
4-15.
Av
ailable
Fields
on
the
LIMIT
T
ABLE
SETUP
Page
4-35
4-16.
Available
Softkeys
on the
LIMIT
T
ABLE
SETUP
P
age
.
.
.
.
.
.
.
.
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.
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.
. .
. .
4-36
4-17.
Sw
ap
P
arameter
F
unction
.
. .
. .
. .
.
.
.
.
4-37
4-18.
Tolerance
Mo de
and Sequen
tial
Mo
de
.
.
.
.
.
.
4-38
4-19.
Limit
T
able
Using
the
Sequen
tial
Mo
de
.
.
.
.
.
4-45
4-20.
LIMIT
T
ABLE
SETUP
P
age Example
. .
. .
. 4-47
4-21.
Available
Fields on
the
LIST
SWEEP
SETUP
P
age
4-49
4-22.
Av
ailable
Softk
eys
on
the
LIST
SWEEP
SETUP
P
age
.
.
.
.
.
.
.
.
.
.
. .
.
.
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4-50
4-23.
SEQ
mo
de
and
STEP
mo
de
.
.
.
.
.
.
.
.
.
.
4-51
4-24.
List
Sw
eep
Settings
.
.
.
.
.
.
.
.
.
.
.
.
. .
4-52
4-25.
LIST SWEEP
SETUP P
age Example
.
.
.
.
.
.
4-55
5-1.
Av
ailable
Fields
on
the
CA
T
ALOG P
age .
.
.
.
5-2
5-2.
Av
ailable
Softk
eys
on
the
CA
T
ALOG
P
age
.
.
.
5-2
5-3.
CA
T
ALOG
P
age
Example
.
.
.
.
.
.
.
.
.
.
.
5-4
5-4.
Av
ailable
Fields
on
the
SYSTEM CONFIG
P
age
.
5-6
5-5.
Av
ailable
Softk
eys
on
the
SYSTEM
CONFIG
P
age
5-7
5-6.
SYSTEM
CONFIG
page
Example
.
.
.
.
.
.
.
5-10
5-7.
Av
ailable
Fields
on the
SELF
TEST
P
age
.
.
.
.
5-12
5-8.
Av
ailable
Softk
eys
on
the
SELF
TEST
P
age
. .
.
5-12
6-1.
Denition
of
Imp
edance
.
.
.
.
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.
6-3
6-2. V
ector Represen
tation
of
Admittance
.
.
.
.
.
.
6-4
6-3.
Capacitance
Circuit
Mo
de
Selection .
. .
. .
. .
6-6
6-4.
Inductance
Circuit
Mo
de Selection
. .
. .
. .
.
6-7
6-5.
Simplied
Mo
del
of
Signal
Lev
el
and
DUT
.
.
.
. 6-8
6-6.
Four-T
erminal
P
air
Measuremen
t
Principle
.
.
.
6-9
6-7.
Measuremen
tCon
tacts .
. .
. .
.
.
.
.
.
.
.
6-10
6-8.
Mo
del
of
Capacitance
to
Ground
. .
. .
. .
. .
6-11
6-9.
Reducing Capacitance
to
Ground
.
.
.
.
.
.
.
.
6-12
6-10. Con
tact Resistance
. . . . . . . .
. . . . . . 6-13
6-11.
Extending The F
our-Terminal P
air Test Leads
. . 6-13
6-12. Measuremen
tCon
tacts for T
est Leads Extension
. 6-14
6-13. Example DUT Guard Plate Connection
. . . . . 6-15
6-14. Guard Shield
. . . . . . . . . . . . . . . . 6-15
6-15. Sample Shorting Plate
. . . . . . .
. . . . . 6-19
6-16. Shorting Plate Connection .
. . . . . . . . . . 6-20
6-17. Parasitic Impedance Mo del (Using the 16047A/C/D) 6-22
6-18. Typical Characteristics of Comp onents . . . . . 6-23
6-19. Connecting the 16047A . . . . . . . . . . . . 6-25
6-20. Connecting A Shorting Bar . . . . . . . . . . 6-26
6-21. Connecting DUT . . . . . . . . . . . . . . . 6-27
6-22. Measurement Results of A 470 pF Capacitor . . . 6-27
6-23. Connecting the 16047A . . . . . . . . . . . . 6-29
Contents-17