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General| Brand | Agilent Technologies |
|---|---|
| Model | 4155C |
| Category | Measuring Instruments |
| Language | English |
Material provided "as is", disclaims warranties, not liable for damages.
Furnished under license, used/copied according to license terms.
Software for U.S. Gov. prime contract/subcontract, subject to standard license terms.
Reference information for the Agilent 4155/4156 VXIplug&play driver functions.
Reference information for the Agilent E5250A VXIplug&play driver functions.
Covers fundamental information for programming with the Agilent 4155/4156 VXIplug&play driver.
Explains how to create a project template using Microsoft Visual Basic.
Guides on creating a measurement program using the project template.
Explains subprograms for enabling/disabling channels and performing high-speed spot measurements.
Explains subprograms for multi-channel spot measurement of bipolar transistors.
Explains subprograms for staircase sweep measurement and saving data.
Explains subprograms for staircase sweep measurement using synchronous sweep source.
Explains subprograms for multi-channel sweep measurement of bipolar transistors.
Explains subprograms for pulsed spot measurement of MOSFET drain current.
Explains subprograms for multi-channel pulsed spot measurement of bipolar transistors.
Explains subprograms for pulsed sweep measurement of bipolar transistor Ic-Vc characteristics.
Explains subprograms for staircase sweep with pulsed bias measurement of MOSFET Id-Vd.
Explains subprograms for sampling measurement and resistance calculation.
Explains subprograms for stress measurement and displaying results.
Covers fundamental information for programming with the Agilent 4155/4156 VXIplug&play driver in .NET.
Guides on creating a project template using Microsoft Visual Basic .NET.
Details on creating a measurement program using the project template.
Provides an example subprogram for performing high-speed spot measurement of MOSFET drain current.
Provides an example subprogram for multi-channel spot measurement of bipolar transistors.
Provides an example subprogram for staircase sweep measurement of MOSFET Id-Vd characteristics.
Provides an example subprogram for staircase sweep measurement using a synchronous sweep source.
Provides an example subprogram for multi-channel sweep measurement of bipolar transistors.
Provides an example subprogram for pulsed spot measurement of MOSFET drain current.
Provides an example subprogram for multi-channel pulsed spot measurement of bipolar transistors.
Provides an example subprogram for pulsed sweep measurement of bipolar transistor Ic-Vc characteristics.
Provides an example subprogram for staircase sweep with pulsed bias measurement of MOSFET Id-Vd.
Provides an example subprogram for sampling measurement and resistance calculation.
Provides an example subprogram for stress measurement and displaying results.
Covers fundamental information for programming with the Agilent 4155/4156 VXIplug&play driver in C++.
Explains how to create a project template in the C language.
Guides on creating a measurement program using the project template.
Explains an example subprogram for high-speed spot measurement of MOSFET drain current.
Explains an example subprogram for multi-channel spot measurement of bipolar transistors.
Explains an example subprogram for staircase sweep measurement of MOSFET Id-Vd characteristics.
Explains an example subprogram for staircase sweep measurement using a synchronous sweep source.
Explains an example subprogram for multi-channel sweep measurement of bipolar transistors.
Explains an example subprogram for pulsed spot measurement of MOSFET drain current.
Explains an example subprogram for multi-channel pulsed spot measurement of bipolar transistors.
Explains an example subprogram for pulsed sweep measurement of bipolar transistor Ic-Vc characteristics.
Explains an example subprogram for staircase sweep with pulsed bias measurement of MOSFET Id-Vd.
Explains an example subprogram for sampling measurement and resistance calculation.
Explains an example subprogram for stress measurement and displaying results.
Covers fundamental topics for programming with Agilent VEE and the VXIplug&play driver.
Describes how to register the VXIplug&play driver on Agilent VEE.
Explains the use of To/From, Data, and Display objects for instrument control in VEE.
Guides on defining transactions (driver functions) within the To/From object in VEE.
Details how to set input parameters using the Edit Function Panel dialog box in VEE.
Explains how to access context-based Help for parameters in VEE.
Describes using variables in the Parameters tab of the Edit Function Panel in VEE.
Guides on creating output terminals in the To/From object for measurement data in VEE.
Explains displaying and connecting the Data-Real object for input parameters in VEE.
Explains displaying and connecting the Display-AlphaNumeric object for output data in VEE.
Provides tips for debugging programs in Agilent VEE, including using error checking functions.
Explains how to use hp4156b_errorQueryDetect and hp4156b_error_query for error checking.
Lists functions with restrictions when used within Agilent VEE.
Explains functions for making high-speed spot measurements using VEE.
Explains functions for multi-channel spot measurements of bipolar transistors in VEE.
Explains functions for making staircase sweep measurements in VEE.
Explains the use of hp4156b_setSweepSync for synchronous sweep measurements in VEE.
Explains functions for making multi-channel sweep measurements in VEE.
Explains functions for making pulsed spot measurements in VEE.
Explains functions for multi-channel pulsed spot measurements of bipolar transistors.
Explains functions for making pulsed sweep measurements in VEE.
Explains functions for staircase sweep with pulsed bias measurements in VEE.
Explains functions for sampling measurements in VEE.
Explains functions for applying stress force and measuring current in VEE.
Introduces sample application programs for Agilent VEE with 4155/4156.
Explains the equipment and accessories required and how to install the sample programs.
Covers program execution flow, panel display, and execution steps for sample1.vee.
Covers program execution flow, panel display, and execution steps for sample2.vee.
Provides examples of modifications to sample1.vee and sample2.vee programs.
Explains how to change the GPIB address of the 4155/4156 and E5250A in Agilent VEE.
Guides on changing source and switching setups for Vth measurement in VEE.
Demonstrates removing objects for a test device (e.g., device 2) in sample programs.
Explains how to modify programs to remove objects for a substrate terminal of device 1.
Shows how to modify programs to add Vth measurement and display objects for a third MOSFET.
Explains how to add a measurement parameter like drain current Id to sample programs.
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