Agilent Technologies 4156b User Manual

User’s Guide
Volume 2
Measurement and Analysis
Agilent 4155B Semiconductor Parameter Analyzer
Agilent 4156B Precision Semiconductor Parameter Analyzer
Agilent Part No. 04156-90200
Printed in Japan May 2000
Edition 5
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Agilent Technologies 4156b Specifications

General

Brand	Agilent Technologies
Model	4156b
Category	Measuring Instruments
Language	English

Summary

Measurement Units

Source/Monitor Unit (SMU)

Details the Source/Monitor Unit (SMU) functionality, modes, and types (HRSMU, MPSMU, HPSMU).

Voltage Source Unit (VSU)

Pulse Generator Unit (PGU)

Measurement Mode

Sweep Measurement Mode

Details the operation of sweep measurements, including basic, subordinate, and synchronous types.

Sampling Measurement Mode

Explains sampling measurement modes: linear, thinned-out, and logarithmic.

Measurement Functions

Stress Force Function

Describes the Stress Force Function, including DC and AC stress capabilities.

Knob Sweep Function

Compliance

Explains compliance settings for SMUs and VSUs to protect test devices from overcurrent/overvoltage.

Zero Offset Cancel

Making a Measurement

Connecting DUT

Provides instructions on connecting the device under test (DUT) to the test fixture or connector plate.

Sweep Measurements

Sampling Measurements

Stress Force

If You Have A Problem

When You Make A Measurement

Addresses common problems encountered during measurements and provides solutions.

If Errors Occur

Lists and explains error codes and messages, and how to interpret status indicators.