Agilent Technologies 4155C User Manual

7-32 Agilent 4155C/4156C VXIplug&play Driver User’s Guide, Edition 4
Sample Application Programs Using VEE
Customizing Sample Programs
To Remove a Source Output
If the number of terminals for your device is less than four, modify the program as
shown below. This example modifies sample2.vee, and removes objects for the
substrate terminal of device 1 (the example does not modify the objects for
device 2).
1. Open the Vth Measurement object using the Agilent VEE program explorer.
2. Display the program, and cut the following three objects.
• Substrate SMU Ch
•Substrate Pin
• Substrate Voltage
3. Open the Formula object, and delete the sub_ch and sub_pin input terminals.
4. Change the formula, defined in the Formula object, as shown below.
[drain_ch*100+drain_pin, gate_ch*100+gate_pin, source_ch*100+source_pin, 0]
Figure 7-19 To Remove a Source Output (1)
1
2
3
4

Agilent Technologies 4155C Specifications

General

Brand	Agilent Technologies
Model	4155C
Category	Measuring Instruments
Language	English