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Agilent Technologies E444xAU Option H37 Manual

Agilent Technologies E444xAU Option H37
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Chapter 4
Front-Panel Key and SCPI Command Reference
Measure
160
Front-Panel Key and SCPI Command
Reference
4.3.5 AM Depth
Allows the user to switch to AM Depth measurement.
4.3.5.1 SCPI Remote Commands
:CONFigure:AMDepth
:INITiate:AMDepth
:FETCh:AMDepth[n]?
:MEASure:AMDepth[n]?
:READ:AMDepth[n]?
Mode: MRECEIVE
Key Path:
Measure
Remote Command: :CONFigure:AMDepth
Notes: This key invokes AM Depth Measurement.
Example: :CONF:AMD
Index: n
<Mnemonic>
Results Returned
0 Returns unprocessed I/Q trace data, as a series of comma-separated trace points, in volts. The I
values are listed first in each pair, using the 0 through even-indexed values. The Q values are the
odd-indexed values.
not specified
or n = 1
Returns comma-separated scalar results, in the following order:
AM Depth (% or dB, depending on setting of Display Unit)
AM Depth Ratio (–999 in Normal mode, Ratio: dB or % depending on Ratio Mode setting)
Ratio Reference Depth (dB or % depending on Display Units)
Modulation Rate (Hz)
Modulation Distortion (%)
Modulation SINAD (dB)
Sample Time (seconds) is a floating point number representing the time between samples when
querying the demod trace (n=2)
Number of samples is the number of data points in the demod trace. It is used when querying the
demod trace (n=2).
2 Return demodulated waveform vs. time data, as a series of comma-separated trace points. The result
is a series of real numbers in percents.

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Agilent Technologies E444xAU Option H37 Specifications

General IconGeneral
BrandAgilent Technologies
ModelE444xAU Option H37
CategoryMeasuring Instruments
LanguageEnglish

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