HP 54520 Series - Page 142

Define Measure Menu
Waveform Compare Menu
When the compare test is on, each point of the input channel or function is
compared against the memory pair. The channel or function and the memory
pair must have valid data stored in them and must be set to on. Holes are
ignored during the test. If the input channel waveform point falls within the
mask memory pair, the test passes. If the waveform falls outside the memory
pair, the point is tested against the allowance value with a resulting PASS or
FAIL message. If the test fails, a failbar is displayed above the graticule
showing the point or points that failed the test. The compare test runs only
on 500-point records.
In the compare mode, the 16-bit words in the memory and channel buffers
are directly compared to the pulse mask memories. Because the compare is
performed on the 16-bit unscaled data, this test is faster than the limit test.
If you are generating a mask without having the oscilloscope generate the
mask for you, make sure the test is set up so that the upper mask is in
memory m1 for memory pair ml & m2 or memory 3 for memory pair m3 &
m4. Likewise, the lower mask must be in memory m2 for memory pair ml &
m2 or m4 for memory pair m3 & m4. If the masks are stored to the reverse of
the memory pairs, the test will fail.
Test Softkey
The test softkey toggles the compare test routine on or off. When the test
is turned on, the oscilloscope compares the input channel waveform against
the selected memory pair. PASS or FAIL is displayed when the test is
complete. If the test fails, the failed points are displayed above the graticule
at the point of failure.
"Mask Editor Menu" in Chapter 10 for more information on creating waveform
masks.
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