HP 54540 Series - Page 139

Define Measure Menu
Limit Test Menu
on Fail, Save Softkey
The on fail, save softkey allows you to determine what happens to the
data from each source ona failure. You select the source and destination of
the save function by pressing the softkey until the desired parameter is
highlighted, then by turning the entry knob to scroll through the available
choices. The source choices are any channel, function, or the screen. The
destination choices are off (not saved), waveform memories, multiple
memories, pixel memories, and hardcopy. The available destination choices
depend on the source selected.
e Channel — off, nonvolatile memories, or multiple
e Function — off, nonvolatile memories, or multiple
e Screen — off, pixel memories, or hardcopy.
The type or amount of failure data saved depends on the destination
selected. If the channel or function being sent to a destination is turned off,
the message "data invalid nothing stored" is displayed.
When saving to a waveform memory, you can select one memory. Only the
waveform viewing area is saved to the memory. If multiple failures occur,
only the last failure data is saved because the most current data overwrites
the memory contents. More than one source can use the same waveform
memory. However, as each source is saved to that memory, the previous
contents are overwritten. If a waveform memory is set to protected, the
message “protect on: cannot store to memory" is displayed.
When saving to multiple memories, you can save up to 665 records (data
includes a time/date stamp). Only the waveform viewing area is saved to the
memory. If multiple failures occur and stop after fail mode is selected, then
the test terminates after all available memory space is filled. If the continue
after fail mode is selected, after the 665 memories are filled, the data records
wrap around and new data overwrites previous data. If more than one source
is specified with a multiple destination, then the data records are partitioned
between the specified sources. Because the multiple memories are are
volatile, cycling power results in a loss of data stored to them.
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