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HP 8753D - Page 331

HP 8753D
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Figure 6-46. Full Two-P
ort Error Model Equations
In addition to the errors removed by accuracy enhancement, other systematic errors exist
due to limitations of dynamic accuracy
, test set switch repeatability
, and test cable stability
.
These, combined with random errors
, also contribute to total system measurement uncertainty
.
Therefore, after accuracy enhancement procedures are performed, residual measurement
uncertainties remain.
6-64 Application and Operation Concepts