HP 8920B - Page 266

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Chapter 5, Advanced Operations
Status Reporting
Status Register Structure Overview
The structure of the register groups used in the Test Set is based upon the status
data structures outlined in the IEEE 488 and SCPI 1994.0 Standards. There are
two types of status data structures used in the Test Set: status registers and status
queues. The general models, components, and operation of each type of status
data structure are explained in the following sections.
Figure 5 Status Data Structure - Register Model
- - -Test Set States Continuously Monitored - - -
15 14 201
15 14 201
15 14 201
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Logical
OR
Summary Message
Bit
Event Enable
Register
(Selects which Events
can set the Summary
Message Bit)
Event Register
(Latched Conditions)
Positive Transition
Filter
Negative Transition
Filter
(Positive and Negative
Transition Filters select
which transitions of
Condition Bits will set
corresponding Event Bits.
)
Condition Register
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