Huawei ME909s Series - Reliability Features

HUAWEI ME909s Series LTE Mini PCIe Module
Hardware Guide
Electrical and Reliability Features
Issue 02 (2016-09-07)
Huawei Proprietary and Confidential
Copyright © Huawei Technologies Co., Ltd.
54

All power consumption test configuration can be referenced by GSM Association Official
Document TS.09: Battery Life Measurement and Current Consumption Technique.

LTE test condition: 10/20 MHz bandwidth, QPSK (Quadrature Phase Shift Keying), 1 RB
when testing max. Tx power and full RB when testing 0 dBm or 10 dBm.

Test condition: For Max. Tx. power, see 4.4.2 Conducted Transmit Power, which are listed
inTable 4-5 and Table 4-6 ; for Max. data throughput, see 2.2 Function Overview, which are
listed in Table 2-1 .
5.5 Reliability Features
Table 5-11 lists the test conditions and results of the reliability of the ME909s Mini
PCIe module.
Table 5-11 Test conditions and results of the reliability of the ME909s Mini PCIe module
Item
Test Condition
Standard
Sample size
Results
Stress
Low-temperature
storage

Temperature: –40ºC

Operation mode: no
power, no package

Test duration: 24 h
JESD22-
A119-C
3 pcs/group
Visual inspection: ok
Function test: ok
RF specification: ok
High-temperature
storage

Temperature: 85ºC

Operation mode: no
power, no package

Test duration: 24 h
JESD22-
A103-C
3 pcs/group
Visual inspection: ok
Function test: ok
RF specification: ok
Low-temperature
operating

Temperature: –40ºC

Operation mode:
working with service
connected

Test duration: 24 h
IEC60068
-2-1
3 pcs/group
Visual inspection: ok
Function test: ok
RF specification: ok
High-temperature
operating

Temperature: 85ºC

Operation mode:
working with service
connected

Test duration: 24 h
JESD22-
A108-C
3 pcs/group
Visual inspection: ok
Function test: ok
RF specification: ok
Temperature
cycle operating

High temperature:
85ºC

Low temperature:
–40ºC

Operation mode:
working with service
connected

Test duration: 30
cycles;1 h+1 h/cycle
JESD22-
A105-B
3pcs/group
Visual inspection:
OK
Function test: OK
RF specification:
OK