Infineon Technologies TC1784 - Debug Event Generation

TC1784
On-Chip Debug Support (OCDS)
User´s Manual 15-7 V1.1, 2011-05
OCDS, V1.5
Figure 15-3 Basic TriCore Debug Concept
15.2.1.2 Debug Event Generation
If debug mode is enabled, debug events can be generated by:
• Debug event generation from debug triggers
• Activation of the external Core Break-In signal to the core
• Execution of a DEBUG instruction
• Execution of an MTCR/MFCR instruction
Debug Event Generation from Debug Triggers
The debug event generation unit is responsible for generating debug events when a
programmable set of debug triggers is active. Debug triggers can be generated by the
code and data protection logic.
These debug triggers provide the inputs to a programmable block of combinational logic
that outputs debug events. The aim is to be able to specify the breakpoints that use fairly
simple criteria purely in the on-chip debug event generation unit, and to rely on help from
the external debug system or debug monitor to implement more complex breakpoints.
TriCore_OCDS.vsd
Debug
Event
Generation
Debug Triggers
Debug
Event
Processing
Core Break -In
Execution of the
DEBUG Instruction
Execution of MTCR /
MFCR Instruction