Intel P4000 - DATASHEET REV 001 - TAP Signals; Table 6-29 TAP Signals

Signal Description
78 Datasheet
6.9 TAP Signals
Table 6-29.TAP Signals
Signal Name Description
Direction/Buffer
Type
TCK TCK (Test Clock): Provides the clock input
for the processor Test Bus (also known as
the Test Access Port).
I
CMOS
TDI TDI (Test Data In): Transfers serial test
data into the processor. TDI provides the
serial input needed for JTAG specification
support.
I
CMOS
TDO Test Data Output O
CMOS
TDI_M Test Data In for the GPU/Memory core:
Tie TDI_M and TDO_M together on the
motherboard
I
CMOS
TDO_M Test Data Output from the processor
core: Tie TDO_M and TDI_M together on the
motherboard.
O
CMOS
TMS TMS (Test Mode Select): A JTAG
specification support signal used by debug
tools.
I
CMOS
TRST# TRST# (Test Reset) Boundary-Scan test
reset pin
I
CMOS
TAPPWRGOOD Power good for ITP O
Asynchronous CMOS