Keithley Series 2600 User Manual

A-53
APPENDIX A
Scripts
Rev1: JAC 6.26.2007
]]--
------------------ Keithley TSP Function ------------------
function FET_Thres_Search(vdssource, lowvgs, highvgs, targetid) --Configure SMUA to source
a user-defined voltage on
--the drain-source (Vds) while SMUB sources a voltage on --the gate-source (Vgs). VGS is
varied using a binary
--search algorithm between a maximum and minimum Vgs value, and the drain-source current
(Id) is measured.
--If measured value is outside the tolerance, search is performed again until the value
falls within the
--specified range or the iteration limit is reached.
--Returns measured Vds, Vth, and Id.
local l_k --binary search loop count variable
local l_k_max = 20 --Maximum loop counts
local l_vds_source = vdssource --vdssource value
local l_high_vgs = highvgs --Start Ib high limit
local l_low_vgs = lowvgs --Start Ib lo limit
local l_target_id = targetid --Target Ic for binary search
local l_nplc = 1
local l_vgs_source = 0--Gate-sourced voltage
local l_id_meas --Drain-source measured voltage
--Default values and level check
if (l_vds_source == nil) then --Use default value
l_vds_source = 0.5
end --if
if (l_low_vgs == nil) then --Use default value
l_low_vgs = 0.5
end --if
if (l_high_vgs == nil) then --Use default value
l_high_vgs = 1.1
end --if
if (l_target_id == nil) then --Use default value
l_target_id = 1e-6
end --if
smua.reset() --Reset SMU
smub.reset() --Reset SMU

Keithley Series 2600 Specifications

General

Model	Series 2600
Measurement Functions	Voltage, Current, Resistance, Power
Resolution	Up to 6.5 digits
Current Source Range	Up to 10A
Communication Interfaces	GPIB, USB
Applications	Semiconductor testing
Category	Source Measure Unit (SMU)
Channels	Single or Dual Channel (varies by model)

Summary

Section 1 General Information

1.1 Introduction

Discusses system configurations for application programs.

1.2 Hardware Configuration

Details system hardware configuration.

1.2.1 System Configuration

Describes the overall hardware configuration of a test system.

1.2.2 Remote/Local Sensing Considerations

Discusses sensing methods for optimizing accuracy.

1.3 Graphing

Explains how to visualize data using graphing.

Section 2 Two-terminal Device Tests

2.1 Introduction

Introduces tests for two-terminal devices.

2.2 Instrument Connections

Details instrument connections for two-terminal device tests.

2.3 Voltage Coefficient Tests of Resistors

Explains testing voltage coefficient of resistors.

2.4 Capacitor Leakage Test

Details testing capacitor leakage current.

2.5 Diode Characterization

Explains diode characterization tests.

Section 3 Bipolar Transistor Tests

3.1 Introduction

Introduces bipolar transistor tests.

3.2 Instrument Connections

Details instrument connections for bipolar transistor tests.

3.3 Common-Emitter Characteristics

Explains testing common-emitter characteristics for transistors.

3.4 Gummel Plot

Explains generating Gummel plots for transistors.

3.5 Current Gain

Discusses methods for measuring DC and AC current gain.

3.6 Transistor Leakage Current

Explains testing transistor leakage current.

Section 4 FET Tests

4.1 Introduction

Introduces FET testing.

4.2 Instrument Connections

Details instrument connections for FET tests.

4.3 Common-Source Characteristics

Explains common-source characteristics for FETs.

4.4 Transconductance Tests

Details transconductance testing for FETs.

4.5 Threshold Tests

Explains methods for determining FET threshold voltage.

Section 5 Using Substrate Bias

5.1 Introduction

Introduces substrate bias concepts.

5.2 Substrate Bias Instrument Connections

Details instrument connections for substrate bias.

5.3 Source-Measure Unit Substrate Biasing

Discusses SMU substrate biasing methods.

5.4 BJT Substrate Biasing

Explains substrate bias for BJTs.

Section 6 High Power Tests

6.1 Introduction

Introduces high power testing challenges.

6.1.1 Program 15 Test Configuration

Details test setup for high current tests.

6.1.2 Example Program 15: High Current Source and Voltage Measure

Shows high current sourcing with voltage measurement.

6.2 Instrument Connections

Details instrument connections for high power tests.

6.2.1 Program 16 Test Configuration

Details test setup for high voltage tests.

6.2.2 Example Program 16: High Voltage Source and Current Measure

Shows high voltage sourcing with current measurement.

Appendix A Scripts

Two-Terminal Device Scripts

Contains scripts for two-terminal device tests.

Bipolar Transistor Scripts

Contains scripts for bipolar transistor tests.

High Power Test Scripts

Contains scripts for high power tests.

FET Test Scripts

Contains scripts for FET tests.

Substrate Bias Scripts

Contains scripts for substrate bias tests.