Keithley Series 2600

Table of Contents
Section 1 General Information
1.1 Introduction . . . . . . . . . . . . . . . . . . . . . .1-1
1.2 Hardware Configuration . . . . . . . . . . . . . . .1-1
1.2.1 System Configuration . . . . . . . . . . . . .1-1
1.2.2 Remote/Local Sensing Considerations. . . . .1-2
1.3 Graphing. . . . . . . . . . . . . . . . . . . . . . . .1-2
Section 2 Two-terminal Device Tests
2.1 Introduction . . . . . . . . . . . . . . . . . . . . . .2-1
2.2 Instrument Connections . . . . . . . . . . . . . . .2-1
2.3 Voltage Coefficient Tests of Resistors . . . . . . . .2-1
2.3.1 Test Configuration . . . . . . . . . . . . . . .2-1
2.3.2 Voltage Coefficient Calculations . . . . . . . .2-1
2.3.3 Measurement Considerations . . . . . . . . .2-2
2.3.4 Example Program 1:
Voltage Coefficient Test . . . . . . . . . . . .2-2
2.3.5 Typical Program 1 Results . . . . . . . . . . .2-3
2.3.6 Program 1 Description . . . . . . . . . . . . .2-3
2.4 Capacitor Leakage Test . . . . . . . . . . . . . . . .2-3
2.4.1 Test Configuration . . . . . . . . . . . . . . .2-3
2.4.2 Leakage Resistance Calculations . . . . . . . .2-3
2.4.3 Measurement Considerations . . . . . . . . .2-4
2.4.4 Example Program 2:
Capacitor Leakage Test . . . . . . . . . . . . .2-4
2.4.5 Typical Program 2 Results . . . . . . . . . . .2-4
2.4.6 Program 2 Description . . . . . . . . . . . . .2-5
2.5 Diode Characterization. . . . . . . . . . . . . . . .2-5
2.5.1 Test Configuration . . . . . . . . . . . . . . .2-5
2.5.2 Measurement Considerations . . . . . . . . .2-5
2.5.3 Example Program 3:
Diode Characterization . . . . . . . . . . . .2-5
2.5.4 Typical Program 3 Results . . . . . . . . . . .2-6
2.5.5 Program 3 Description . . . . . . . . . . . . .2-6
2.5.6 Using Log Sweeps . . . . . . . . . . . . . . .2-7
2.5.7 Using Pulsed Sweeps . . . . . . . . . . . . . .2-7
Section 3 Bipolar Transistor Tests
3.1 Introduction. . . . . . . . . . . . . . . . . . . . . 3-1
3.2 Instrument Connections . . . . . . . . . . . . . . 3-1
3.3 Common-Emitter Characteristics . . . . . . . . . 3-1
3.3.1 Test Configuration . . . . . . . . . . . . . . 3-2
3.3.2 Measurement Considerations . . . . . . . . 3-2
3.3.3 Example Program 4:
Common-Emitter Characteristics . . . . . . 3-2
3.3.4 Typical Program 4 Results . . . . . . . . . . 3-3
3.3.5 Program 4 Description . . . . . . . . . . . . 3-3
3.4 Gummel Plot . . . . . . . . . . . . . . . . . . . . 3-3
3.4.1 Test Configuration . . . . . . . . . . . . . . 3-3
3.4.2 Measurement Considerations . . . . . . . . 3-4
3.4.3 Example Program 5: Gummel Plot. . . . . . 3-4
3.4.4 Typical Program 5 Results . . . . . . . . . . 3-5
3.4.5 Program 5 Description . . . . . . . . . . . . 3-5
3.5 Current Gain . . . . . . . . . . . . . . . . . . . . 3-6
3.5.1 Gain Calculations . . . . . . . . . . . . . . 3-6
3.5.2 Test Configuration for Search Method. . . . 3-6
3.5.3 Measurement Considerations . . . . . . . . 3-6
3.5.4 Example Program 6A: DC Current Gain
Using Search Method. . . . . . . . . . . . . 3-6
3.5.5 Typical Program 6A Results . . . . . . . . . 3-7
3.5.6 Program 6A Description . . . . . . . . . . . 3-7
3.5.7 Modifying Program 6A . . . . . . . . . . . . 3-7
3.5.8 Configuration for Fast Current Gain Tests. . 3-8
3.5.9 Example Program 6B: DC Current Gain
Using Fast Method . . . . . . . . . . . . . . 3-8
3.5.10 Program 6B Description . . . . . . . . . . . 3-9
3.5.11 Example Program 7: AC Current Gain . . . . 3-9
3.5.13 Typical Program 7 Results . . . . . . . . . . 3-10
3.5.14 Program 7 Description . . . . . . . . . . . . 3-10
3.5.15 Modifying Program 7. . . . . . . . . . . . . 3-10
3.6 Transistor Leakage Current . . . . . . . . . . . . 3-10
3.6.1 Test Configuration . . . . . . . . . . . . . . 3-10
3.6.2 Example Program 8: I
CEO
Test . . . . . . . . 3-11
3.6.3 Typical Program 8 Results . . . . . . . . . . 3-11
3.6.4 Program 8 Description . . . . . . . . . . . . 3-11
3.6.5 Modifying Program 8. . . . . . . . . . . . . 3-12
Section 4 FET Tests
4.1 Introduction. . . . . . . . . . . . . . . . . . . . . 4-1
4.2 Instrument Connections . . . . . . . . . . . . . . 4-1