Keithley Series 2600 User Manual

4.3 Common-Source Characteristics . . . . . . . . . 4-1
4.3.1 Test Configuration . . . . . . . . . . . . . . 4-1
4.3.2 Example Program 9: Common-Source
Characteristics . . . . . . . . . . . . . . . . 4-1
4.3.3 Typical Program 9 Results . . . . . . . . . . 4-2
4.3.4 Program 9 Description . . . . . . . . . . . . 4-2
4.3.5 Modifying Program 9. . . . . . . . . . . . . 4-3
4.4 Transconductance Tests . . . . . . . . . . . . . . 4-3
4.4.1 Test Configuration . . . . . . . . . . . . . . 4-3
4.4.2 Example Program 10: Transconductance
vs. Gate Voltage Test . . . . . . . . . . . . . 4-4
4.4.3 Typical Program 10 Results . . . . . . . . . 4-5
4.4.4 Program 10 Description . . . . . . . . . . . 4-5
4.5 Threshold Tests . . . . . . . . . . . . . . . . . . . 4-6
4.5.1 Search Method Test Configuration. . . . . . 4-6
4.5.2 Example Program 11A: Threshold Voltage
Tests Using Search Method. . . . . . . . . . 4-6
4.5.3 Program 11A Description . . . . . . . . . . 4-7
4.5.4 Modifying Program 11A . . . . . . . . . . . 4-7
4.5.5 Self-bias Threshold Test Configuration . . . 4-7
4.5.6 Example Program 11B: Self-bias
Threshold Voltage Tests . . . . . . . . . . . 4-8
4.5.7 Program 11B Description . . . . . . . . . . 4-9
4.5.8 Modifying Program 11B . . . . . . . . . . . 4-9
Section 5 Using Substrate Bias
5.1 Introduction. . . . . . . . . . . . . . . . . . . . . 5-1
5.2 Substrate Bias Instrument Connections . . . . . 5-1
5.2.1 Source-Measure Unit Substrate Bias
Connections and Setup . . . . . . . . . . . 5-1
5.2.2 Voltage Source Substrate Bias Connections . 5-2
5.3 Source-Measure Unit Substrate Biasing . . . . . 5-2
5.3.1 Program 12 Test Configuration . . . . . . . 5-2
5.3.2 Example Program 12: Substrate Current
vs. Gate-Source Voltage . . . . . . . . . . . 5-2
5.3.3 Typical Program 12 Results . . . . . . . . . 5-4
5.3.4 Program 12 Description . . . . . . . . . . . 5-4
5.3.5 Modifying Program 12 . . . . . . . . . . . . 5-5
5.3.6 Program 13 Test Configuration . . . . . . . 5-5
5.3.7 Example Program 13: Common-Source
Characteristics with Source-Measure Unit
Substrate Bias . . . . . . . . . . . . . . . . 5-5
5.3.8 Typical Program 13 Results . . . . . . . . . 5-7
5.3.9 Program 13 Description . . . . . . . . . . . 5-7
5.3.10 Modifying Program 13 . . . . . . . . . . . . 5-7
5.4 BJT Substrate Biasing. . . . . . . . . . . . . . . . 5-7
5.4.1 Program 14 Test Configuration . . . . . . . 5-7
5.4.2 Example Program 14: Common-Emitter
Characteristics with a Substrate Bias . . . . 5-7
5.4.3 Typical Program 14 Results. . . . . . . . . . 5-9
5.4.4 Program 14 Description . . . . . . . . . . . 5-9
5.4.5 Modifying Program 14 . . . . . . . . . . . . 5-10
Section 6 High Power Tests
6.1 Introduction. . . . . . . . . . . . . . . . . . . . . 6-1
6.1.1 Program 15 Test Configuration . . . . . . . 6-1
6.1.2 Example Program 15: High Current
Source and Voltage Measure . . . . . . . . . 6-1
6.1.3 Program 15 Description . . . . . . . . . . . 6-2
6.2 Instrument Connections . . . . . . . . . . . . . . 6-2
6.2.1 Program 16 Test Configuration . . . . . . . 6-2
6.2.2 Example Program 16: High Voltage
Source and Current Measure . . . . . . . . 6-2
6.2.3 Program 16 Description . . . . . . . . . . . 6-3
Appendix A Scripts
Section 2. Two-Terminal Devices . . . . . . . . . . . . . A-1
Program 1. Voltage Coefficient of Resistors . . . . . A-1
Program 2. Capacitor Leakage Test . . . . . . . . . A-5
Program 3. Diode Characterization . . . . . . . . . A-8
Program 3A. Diode Characterization Linear Sweep . A-8
Program 3B. Diode Characterization Log Sweep . . A-11
Program 3C. Diode Characterization Pulsed Sweep. A-14
Section 3. Bipolar Transistor Tests . . . . . . . . . . . . A-19
Program 4. Common-Emitter Characteristics . . . . A-19
Program 5. Gummel Plot . . . . . . . . . . . . . . . A-24
Section 6. High Power Tests. . . . . . . . . . . . . . . . A-28
Program 6. Current Gain . . . . . . . . . . . . . . . A-28
Program 6A. Current Gain (Search Method). . . . . A-28
Program 6B. Current Gain (Fast Method) . . . . . . A-32
Program 7. AC Current Gain . . . . . . . . . . . . . A-36
Program 8. Transistor Leakage (ICEO). . . . . . . . A-39
Section 4. FET Tests . . . . . . . . . . . . . . . . . . . . A-43
Program 9. Common-Source Characteristics . . . . A-43
Program 10. Transconductance . . . . . . . . . . . A-48

Keithley Series 2600 Specifications

General

Model	Series 2600
Measurement Functions	Voltage, Current, Resistance, Power
Resolution	Up to 6.5 digits
Current Source Range	Up to 10A
Communication Interfaces	GPIB, USB
Applications	Semiconductor testing
Category	Source Measure Unit (SMU)
Channels	Single or Dual Channel (varies by model)