Program 11. Threshold . . . . . . . . . . . . . . . . A-52
Program 11A. Threshold (Search) . . . . . . . . . . A-52
Program 11B. Threshold (Fast). . . . . . . . . . . . A-56
Section 5. Using Substrate Bias . . . . . . . . . . . . . . A-60
Program 12. Substrate Current vs. Gate-Source
Voltage (FET I
SB
vs. V
GS
) . . . . . . . . . . . A-60
Program 13. Common-Source Characteristics
with Substrate Bias . . . . . . . . . . . . . A-64
Program 14. Common-Emitter Characteristics
with Substrate Bias . . . . . . . . . . . . . . A-71
Section 6. High Power Tests. . . . . . . . . . . . . . . . A-78
Program 15. High Current with
Voltage Measurement . . . . . . . . . . . . A-78
Program 16. High Voltage with
Current Measurement . . . . . . . . . . . . A-80