Electronic Calibration Modules Reference Guide 4-9
Use, Maintenance, and Care of the Devices
Gaging Connectors
Gaging Connectors
The gages available from Keysight Technologies are intended for preventive
maintenance and troubleshooting purposes only. They are effective in
detecting excessive center conductor protrusion or recession, and conductor
damage on DUTs, test accessories, and ECal module test ports. Do not use the
gages for precise pin depth measurements.
Connector Gage Accuracy
The connector gages are only capable of performing coarse measurements.
They do not provide the degree of accuracy necessary to precisely measure the
pin depth. This is partially due to the repeatability uncertainties that are
associated with pin-depth measurements.
With proper technique, the gages are useful in detecting gross pin depth errors
on device connectors. To achieve maximum accuracy, random errors must be
reduced by taking the average of at least three measurements having different
gage orientations on the connector. Even the resultant average can be in error
by as much as ±0.0001 inch (±0.0025 mm) due to systematic (biasing) errors
usually resulting from worn gages and gage masters. The information in
“Typical Pin Depth Values” on page 5-21 assumes new gages and gage
masters. Therefore, these systematic errors were not included in the
uncertainty analysis. As the gages endure more use, the systematic errors can
become more significant in the accuracy of the measurement.
The measurement uncertainties are primarily a function of the assembly
materials and design, and the unique interaction each device type has with the
gage. Therefore, these uncertainties can vary among the different devices.
The observed pin depth limits add in these uncertainties to the typical factory
pin depth values to provide practical limits that can be referenced when using
the gages.
When measuring pin depth, the measured value (resultant average of
three or more measurements) contains measurement uncertainty and is
not necessarily the true value. Always compare the measured value with
the
observed pin depth limits (which account for measurement
uncertainties) in “Typical Pin Depth Values” on page 5-21 to evaluate the
condition of device connectors.
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