Doc# 0296-0018 • REV R (July 2017) Page 38 of 61
Built-in-Test (BIT) Checks
B+
B-
BIT ON
BIT-OFF
TG30
RG30
TG10
RG10
TG03
RG03
TG01
RG01
TC00
TC01
TC02
TC03
TC04
TV1
TV5
INTG-B
INTG00
INTG01
INTG02
INTG10
INTG11
INTG12
INTG20
INTG21
INTG22
Plus Baery Voltage
Negave Baery Voltage
Internal Signal Level with Signal On
Internal Signal Level with Signal O
Test Channel with AGC Gain at 30
Reference Channel with AGC Gain at 30
Test Channel with AGC Gain at 10
Reference Channel with AGC Gain at 10
Test Channel with AGC Gain at 3
Reference Channel with AGC Gain at 3
Test Channel with AGC Gain at 1
Reference Channel with AGC Gain at 1
Test Channel Bias Current Check Bias = 0 mA
Test Channel Bias Current Check Bias = 0.5 mA
Test Channel Bias Current Check Bias = 2.0 mA
Test Channel Bias Current Check Bias = 4.0 mA Test Channel Bias
Current Check Bias = 6.5 mA
Test Channel DC Reference Voltage Check Gain =1
Test Channel DC Reference Voltage Check Gain = 1/5
Reference channel Integrator Reference Point (65 Hz)
Reference No Integrator 65 Hz
Reference 1 Integrator 65 Hz
Reference 2 Integrator 65 Hz
Reference No Integrator 100 Hz
Reference 1 Integrator 100 Hz
Reference 2 Integrator 100 Hz
Reference No Integrator 120 Hz
Reference 1 Integrator 120 Hz
Reference 2 Integrator 120 Hz
External Loopback Checks
AVOLT
BVOLT
CVOLT
CHRG
DISP AC
DISP DC
A Input Channel Check
B Input Channel Check
C Input Channel Check
Charge Channel Check
Displacement Channel AC Check
Displacement Channel AD Check
TABLE 1: BIT TEST CODES AND DESCRIPTIONS
NOTE: If a failure occurs, verify that the unit has been calibrated. If the unit is calibrated and failure(s)
sll occur, then repair is needed. Most failures require repair at the factory.