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leakage or insulation value and so on. High voltage is connected to each pin while other pins are
grounded to observe their current leakage or insulation value. This way it can confirm that all the test
pin high voltage insulation test have no problems, and the number of tests for this method is N-1 times.
This test method is more accurate and it can find the insulation and current leakage value for each pin;
its disadvantage is that it is slower.
One to other test method
(9) Ground Pin
Ground pin set.
(10) Test Rate
Slow: Test method that uses stable test value as top priority
Regular: Test method that finds a balance between stable test value and test speed
Quick: Test method that saves changing time under known test specification conditions
The following requirements must be followed for quick test:
1. Quick test is a test method designed to be used specifically when the insulation value of the test
DUTs are within fixed range and saves time by not jumping sections, and has the goal of gaining
highest capacity.
2. Each 1V can only test 1M ohm 1uA is a very small current.
3. Set the correct test specifications; to test 100M test specifications, the voltage must be set to 100M
ohm.
4. Make suitable adjustments for the test time according to the test DUT.
(11) Max. Pin
Sets the maximum number of pins for the quick binary test.
Select S6 [PREVIOUS] and the LCD screen will display as follows:
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