Tektronix AFG31052

Test records
AFG31000 Series Arbitrary Function Generator Specification and Performance Verification Technical Reference 53
Amplitude test record: CH2
Calibration factor(CF)=2/(1+50Ω/MeasurementΩ)=
Amplitude Minimum Test result Maximum
3.500 V
rms
at 1.00 kHz (3.500×CF-0.035) V
rms
(3.500×CF+0.035) V
rms
DC test record: CH1
(Calibration factor (CF) = 2 / (1 + 50 Ω / Measurement Ω) =)
DC offset Minimum Test result Maximum
+5.000 VDC
(5.000 × CF – 0.051) VDC
(5.000 × CF +0.051) VDC
0.000 VDC
–0.001 VDC
0.001 VDC
–5.000 VDC (–5.000 × CF – 0.051) VDC (–5.000 × CF + 0.051) VDC
DC test record: CH2
(Calibration factor (CF) = 2 / (1 + 50 Ω / Measurement Ω) =)
DC offset Minimum Test result Maximum
+5.000Vdc (5.000 × CF – 0.051) Vdc (5.000 × CF +0.051) VDC
0.000 VDC
–0.001 VDC
0.001 VDC
–5.000 VDC
(–5.000 × CF – 0.051)
VDC
(–5.000 × CF + 0.051)
VDC
AC flatness test record: CH1
AC flatness Minimum Test result Maximum
Frequency 1.00 kHz
(amplitude: 4.0 dB)
_____
dB ( = Reference)
_____
Frequency 500 kHz Reference – 0.20 dB
dB
Reference + 0.20 dB
Frequency 1.00 MHz Reference – 0.20 dB
dB
Reference + 0.20 dB
Frequency 5.00 MHz
Reference – 0.30 dB
dB
Reference + 0.30 dB
Frequency 15.00 MHz Reference – 0.30 dB
dB
Reference + 0.30 dB
Frequency 25.00 MHz
Reference – 0.30 dB
dB
Reference + 0.30 dB
AC flatness test record: CH2
AC flatness Minimum Test result Maximum
Frequency 1.00 kHz
(amplitude: 4.0 dB)
_____
dB ( = Reference)
_____
Frequency 500 kHz Reference – 0.20 dB
dB
Reference + 0.20 dB