Tektronix AFG31052

Test records
64 AFG31000 Series Arbitrary Function Generator Specification and Performance Verification Technical Reference
AFG31251 and AFG31252 test record
Test information
Instrument serial number:
Certificate number:
Temperature: Relative humidity %:
Date of calibration: Technician:
Frequency test record
Frequency Minimum Test result Maximum
Sine at 1.000000 MHz
0.9999984 MHz
1.0000016 MHz
Pulse at 1.000000 MHz 0.9999984 MHz 1.0000016 MHz
Amplitude test record: CH1
Calibration factor(CF)=2/(1+50Ω/MeasurementΩ)=
Amplitude Minimum Test result Maximum
3.000 mV
rms
at 1.00 kHz (3.000×CF-0.384) mV
rms
(3.000×CF+0.384) mV
rms
30.000 mV
rms
at 1.00 kHz (30.000×CF-0.654) mV
rms
(30.000×CF+0.654) mV
rms
300.000 mV
rms
at 1.00
kHz
(300.000×CF-3.354) mV
rms
(300.000×CF+3.354) mV
rms
800.000 mV
rms
at 1.00
kHz
(800.000×CF-8.354) mV
rms
(800.000×CF+8.354) mV
rms
1.500 V
rms
at 1.00 kHz (1.500×CF-0.015) V
rms
(1.500×CF+0.015) V
rms
Amplitude test record: CH2
Calibration factor(CF)=2/(1+50Ω/MeasurementΩ)=
Amplitude Minimum Test result Maximum
3.000 mV
rms
at 1.00 kHz
(3.000×CF-0.384) mV
rms
(3.000×CF+0.384) mV
rms
30.000 mV
rms
at 1.00 kHz
(30.000×CF-0.654) mV
rms
(30.000×CF+0.654) mV
rms
300.000 mV
rms
at 1.00
kHz
(300.000×CF-3.354) mV
rms
(300.000×CF+3.354)
mV
rms
800.000 mV
rms
at 1.00
kHz
(800.000×CF-8.354) mV
rms
(800.000×CF+8.354)
mV
rms
1.500 V
rms
at 1.00 kHz (1.500×CF-0.015) V
rms
(1.500×CF+0.015) V
rms
DC test record: CH1 (Calibration factor (CF) = 2 / (1 + 50 Ω / Measurement Ω) =)
DC offset Minimum Test result Maximum
+2.500 VDC
(2.500 × CF – 0.026) VDC
(2.500 × CF + 0.026) VDC
0.000 VDC
–0.001 VDC
0.001 VDC