Test records
56 AFG31000 Series Arbitrary Function Generator Specification and Performance Verification Technical Reference
Amplitude test record: CH2
Calibration factor(CF)=2/(1+50Ω/MeasurementΩ)=
Amplitude Minimum Test result Maximum
3.000mV
rms
at 1.00 kHz (3.000×CF-0.384) mV
rms
(3.000×CF+0.384) mV
rms
30.000mV
rms
at 1.00 kHz (30.000×CF-0.654) mV
rms
(30.000×CF+0.654) mV
rms
300.000mV
rms
at 1.00 kHz (300.000×CF-3.354) mV
rms
(300.000×CF+3.354) mV
rms
800.000mV
rms
at 1.00 kHz (800.000×CF-8.354) mV
rms
(800.000×CF+8.354) mV
rms
1.500V
rms
at 1.00 kHz (1.500×CF-0.015) V
rms
(1.500×CF+0.015) V
rms
2.000V
rms
at 1.00 kHz (2.000×CF-0.020) V
rms
(2.000×CF+0.020) V
rms
2.500V
rms
at 1.00 kHz (2.500×CF-0.025) V
rms
(2.500×CF+0.025) V
rms
3.500V
rms
at 1.00 kHz (3.500×CF-0.035) V
rms
(3.500×CF+0.035) V
rms
DC test record: CH1
(Calibration factor (CF) = 2 / (1 + 50 Ω / Measurement Ω) =)
DC offset Minimum Test result Maximum
+5.000 VDC (5.000 × CF – 0.051) VDC (5.000 × CF + 0.051) VDC
(–5.000 × CF – 0.051)
VDC
(–5.000 × CF + 0.051)
VDC
DC test record: CH2
(Calibration factor (CF) = 2 / (1 + 50 Ω / Measurement Ω) =)
DC offset Minimum Test result Maximum
+5.000 VDC (5.000 × CF – 0.051) VDC (5.000 × CF + 0.051) VDC
(–5.000 × CF – 0.051)
VDC
(–5.000 × CF + 0.051)
VDC
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