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Tenma 72-7780 - Measurement Procedures; Continuity and Diode Testing

Tenma 72-7780
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measurement,shortthetestleadsanduseRELfunction.
Iftheresistancewhenshortedismorethan0.5Ω,pleasecheckiftestleadsare
loosenedordamaged.
Whenmeasuringhighresistanceabove60MΩ,itisnormaltotak eafewseconds
tosteadythereadings.
Resistancemeasurementcanbeusedtoinspectdevice’sinternalfuses.(see
figure4b)
DonotinputvoltageoverDC60VorAC30V.
3. Continuitymeasurement(seefigure5)
Iftheresistancebeingmeasuredisover150Ω,circuitisinopen
status,buzzerdoesnotgooff.Iftheresistancelessthan10Ω,
circuitisingoodconductionstatus,buzzerwillcontinuouslygooff.
Note:
Toavoidda magetothedevice,beforemeasuringcontinuity,
switchoffallpowersuppliesandfullydischargeallcapacitors.
DonotinputvoltageoverDC60VorAC30V.
4. Diodemeasurement(seefigure6)
“OLsymbolappearswhenthediodeisopenorpolarityis
reversed.
ForsiliconPNjunction,normalvalue:500~800mV(0.5~0.8V).
Notes:
Switchoffthepowersupplytothecircuit,andfullydischarge
allcapacitors
Voltagefortestingdiodeisabout3.1V. 
DonotinputvoltageoverDC60VorAC30V.
5. Capacitancemeasurement(seefigure7)
Whenthereisnoinput,thedevicedisplaysafixedvalue
(intrinsiccapacitance).Forsmallcapacitance
measurement,toensuremeasurementaccuracy,the
measuredvaluemustbesubtractedfromintrinsic
capacitance.Oruserscanmeasuresmallcapacity
capacitorswithrelativemeasurementfunction(REL)(the
devicewillautomaticallysubtracttheintrinsic

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