Agilent Technologies 4339B - Page 217

4339B
High
Capacitance
DUT Measurement
High Capacitance
DUT Measurement
When
the
4339B
measures
a
DUT
that
has
high
capacitance
,
A
C noise
creates major
instability
factors
in
the
measurement
because
capacitance
is
sensitive
to
A
C
noise
.If
you want
to
measure
the
resistance
of
a
high-capacitance
DUT
maintaining
more
than
10
%
of S/N
(Signal/Noise)
ratio
,
the
maximum
capacitance
of
the
DUT's
for
each
measurement
range
are
listed
in
T
able
7-1
.
T
able
7-1.
Maximum
Measurable
Capacitance
Measurement
Range
Measurement
Time
Short Medium Long
100
pA
| 1
nF
10
nF
1
nA
1
nF
10
nF
100
nF
10
nA
10
nF
100
nF
1

F
100
nA
100
nF
1

F
10

F
1

A
1

F
10

F
100

F
10 
A
10 
F
100 
F
1mF
100

A
100

F
| |
T
o measure
a DUT
with even
higher
capacitance
,
connect
a
resistor
in
series
with
DUT
to
reduce
the measurement
icker.
The
16339A
Component
T
est
Fixture
with
its
exchangeable
output
resistors is
an ideal
solution
for
this
application.
The
16339A
has
four
output
resistor
(100
k,
1
M, 10
M,
and
100
M).
Ideally
,
a
higher
series
resistance
enables
more
stable
measurement.
However
,
there are
limitations
to
these
resistances
of
each
measurement
range
,
as
listed
in
T
able
7-2
.
T
able
7-2.
Limit
Output
Resistance
for
Each
Range
Measurement
Range
Output
Resistor
100
pA
100
M
1
nA
10
M
10
nA
1
M

100
nA
100
k
Measurement Basics 7-5