Agilent Technologies 4339B - Page 41

Figures
1-1. P
ower
Cable
Supplied
.
.
.
.
.
.
.
.
.
.
.
.
.
.
..
..
..
..
.
.
.
.
.
1-11
1-2. Floating
DUT
Measurement
Conguration
.
.
.
.
.
.
.
.
.
.
.
.
.
.
..
..
1-19
1-3. Grounded
DUT
Measurement
Conguration
.
.
.
.
.
.
.
.
.
.
.
.
.
.
..
. 1-19
3-1. Front
P
anel
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
..
..
..
..
.
.
.
.
.
.
.
.
.
3-2
3-2. Sequence
Mode
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
..
..
..
.
.
.
.
.
.
3-6
3-3.
Oset-Error
Canceling
Timing
Chart
.
.
.
.
.
.
.
.
.
.
.
.
..
..
..
.
.
3-18
3-4.
Rear
P
anel
.
.
.
.
.
.
.
.
.
.
.
.
.
..
..
..
.
.
.
.
.
.
.
.
.
.
.
.
.
3-20
3-5.
Required
External
Trigger
Pulse
Specication
.
.
.
.
.
.
.
.
.
.
.
..
..
. 3-20
3-6.
Pin
Assignment
for
Handler
Interface
Connector
.
.
.
.
.
.
.
.
.
.
.
.
..
. 3-22
3-7.
Timing
Diagram
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
..
.
.
.
.
.
.
.
3-24
3-8.
Simplied
Model
of
Impedance
Measurement
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
. 3-26
3-9.
4339B
Overall
Block
Diagram
.
.
.
.
.
.
.
.
.
.
.
.
.
.
..
..
..
.
.
.
.
3-27
3-10. Ungrounded
and
Grounded
DUT
Measurement
.
.
.
.
.
.
.
.
.
.
.
.
.
..
3-28
4-1.
Simple
Program
Example
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
..
..
.
.
.
.
.
4-4
4-2.
SRQ
generation
sequence
(when
measurement
nishes)
.
.
.
.
.
.
.
.
.
.
.
4-12
4-3.
Detecting
the
completion
of
measurement
using
SRQ
.
.
.
.
.
.
.
.
.
.
.
.
.
4-13
4-4.
Reading
out
the
measured
result
in
ASCII
transfer
format
by
using
the
*TRG
command
.
.
.
.
.
.
.
.
.
.
.
.
.
.
..
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
4-16
4-5.
Reading
out
the
measured
result
in
binary
transfer
format
using
*TRG
command
4-18
4-6.
Reading
out
the
measured
result
in
ASCII
transfer
format
using
the
:FETC?
command
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
..
.
.
.
.
.
.
.
.
.
.
.
.
.
4-20
4-7.
Reading
out
measured
result
in
binary
transfer
format
using :FETC?
command 4-22
4-8.
Sample
Program
.
.
.
.
.
.
..
..
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
4-29
5-1.
Proper
Use
of
the
Colon
and
Semicolon
.
..
..
.
.
.
.
.
.
.
.
.
.
.
.
.
.
5-2
5-2.
Status
Reporting
Structure
.
.
.
..
..
..
..
.
.
.
.
.
.
.
.
.
.
.
.
.
.
5-40
5-3.
Status
byte
Register
.
.
.
.
.
..
..
..
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
5-41
5-4.
Standard Event
Status Register
..
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
..
5-42
5-5.
Standard Operation
Status Group
Structure .
..
.
.
.
.
.
.
.
.
.
.
.
.
.
.
5-43
5-6.
Trigger System
Conguration .
..
..
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
..
5-45
5-7.
Inside an
ARM Event
Detection State
..
..
.
.
.
.
.
.
.
.
.
.
.
.
.
..
. 5-46
5-8.
Inside
a
TRIG
Event
Detection
State
.
.
.
.
..
.
.
.
.
.
.
.
.
.
.
..
.
.
5-47
5-9. NR1 F
ormat. .. .. .. .... . .. .. .
...............
5-48
5-10. NR2 F
ormat . .
.........................
.....
5-48
5-11. NR3 F
ormat . . .
.... .. .. . .. .... .. .. .. ....
....
5-48
5-12. Real Data F
ormat ...
.... .. .. .. .. .... .. .. .. ...
. 5-49
6-1. Measurement Conguration
.....
.... .. .. .. .. ... .. ..
6-2
6-2. Chip Capacitor Binding . . . . .
.... .. .. .. .. .... .. .. ..
6-3
6-3. Measurement Conguration
................
........
6-5
6-4. Resistivity Cell Setup
.... .. .. .. .. ....
...........
6-6
6-5. Measurement Conguration ........................ 6-9
6-6. Clipping Opened Switch .......................... 6-10
6-7. Printed Results .... .. .. .. .. .... .. .. .. ... .. .. . 6-11
7-1. Volume Resistivity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-3
7-2. Surface Resistivity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-4
7-3. Capacitance Measurement Conguration .. .. .... .. .. .. .... 7-7
9-1. Source Voltage Accuracy TestSetup..................... 9-4
Contents-11