Anritsu SQA-R MP1900A - Jitter and Noise Addition for Stress Testing

9
SI PPG/ED Signal Integrity Evaluation
Jitter/Noise Addition
To perform DUT receiver stressed input tolerance tests, the BER is measured under the worst conditions using a stressed signal with added jitter and
voltage noise. Using the MP1900A series with the Jitter Modulation Source MU181500B, Jitter Tolerance Test MX183000A-PL001 software, and Noise
Generator MU195050A for adding CM/DM/White Noise supports receiver tolerance tests in conformance with the various interface standards. The
MP1900A series offers strong support for receiver stressed input tolerance tests by generating high-quality signals before jitter and noise addition as
well as for adding high-linearity jitter and noise.
Low Error Rate Estimation BER Measurements
Jitter Tolerance Test Function (MX183000A-PL001)
• High-versatility Jitter Tolerance measurements
• PHY Device Jitter Tolerance tests by impressing SJ/RJ/BUJ
• Standards-compliant Mask measurements
• Fast measurement times using low error rate estimation function, such
as 1E–12 and 1E–15
• Tolerance measurements versus device characteristics using four
Binary, Upward, Downward, Binary + Linear methods
Sinusoidal Jitter (SJ) CM/DM NoiseRandom Jitter (RJ) White Noise
DUT Rx
DUT Tx
Asynchronous
Clock
PCB Trace
PCB Trace
10Tap Emphasis
Variable ISI
Jitter/Noise Addition
Multi-band CTLE
Built-in Clock Recovery
GHz