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General| Brand | Hameg |
|---|---|
| Model | HZ65-3 |
| Category | Test Equipment |
| Language | English |
Overview of the HZ65 component tester for testing semiconductors, resistors, capacitors, and inductors.
Highlights the HZ65's robust and portable construction for field use.
Explains the X-Y mode oscilloscope display and two-point testing approach.
Lists components like semiconductors, resistors, capacitors, and inductors tested by HZ65.
Covers test inputs (jacks, sockets) and oscilloscope connections (BNC).
Details test frequency, test voltage, test current, power requirements, and enclosure.
Lists the two test cables (red and black) with probes and banana plugs.
Mentions optional BNC cables (HZ33, HZ34) for extended connectivity.
Describes using HZ65 with oscilloscopes, safety standards, and grounding precautions.
Details the limited warranty, conditions, and shipping recommendations for service.
Covers operating environment, damage indicators, and safety warnings for maintenance.
Guides on setting up the unit, voltage selection, and internal jumper configuration.
Explains the frequency generator, circuit testing, and waveform interpretation for various components.
Details connecting the HZ65 to an oscilloscope and setting up the display baseline.
Guides on testing components using sockets or test cables, and adjusting current settings.
Describes qualitative results by comparing with known good components, identifying leads and types.
Discusses challenges of in-circuit testing due to parallel components and suggests comparison methods.
Illustrates typical oscilloscope traces for short circuits, resistors, diodes, transistors, and capacitors.
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