An interlock circuit is provided on the rear panel of the instrument,
as shown in the following figure.
The interlock is intended for use through a normally open switch,
which may be installed on the lid of a test fixture, on the enclosure of
a semiconductor prober or device handler, or on the door or doors
of a test equipment rack. The switch must be closed to enable the
Model 2461 to produce voltages greater than ± 42 V.
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