4 Error Messages
162 E364xA User’s and Service Guide
607
Rundown too noisy
This test checks the gain repeatability between the integrating ADC and the U17
on-chip ADC. The gain test (606) is performed eight times. Gain noise must be
less than ±64 LSB of the U17 on-chip ADC.
608
Serial configuration readback failed
This test re-sends the last 3 bytes of serial configuration data to all serial paths
(SERDAT, SERBCK, and SERCLK). The data is then clocked back into U16 and
compared against the original 3 bytes sent. A failure occurs if the data do not
match. This test checks the serial data path through U29.
609
[a]
System ADC test failed
This test checks if the ADC hardware is functional. The main controller U10
establishes communication with the ADC and checks if there are any error bits
set for the ADC's status reporting.
624
Unable to sense line frequency
This test checks that the LSENSE logic input U17 is toggling. If no logic input is
detected, the power supply will assume a 50 Hz line operation for all future
measurements.
625
I/O processor did not respond
This test checks that communications can be established between U17 (U10 for
serial MY53xx6xxx) and U7 (U752 for serial MY53xx6xxx) through the isolated
(U9 and U10) (U751 for serial MY53xx6xxx) serial data link. Failure to establish
communication in either direction will generate an error. If this condition is
detected at power-on self-test, the power supply will beep and the error
annunciator will be turned on.
626
I/O processor failed self-test
This test causes the earth-referenced processor U7 (U752 for serial MY53xx6xxx)
to execute an internal RAM test. Failure will generate an error.
Table 4-2 Self-test error messages
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