ℕ
Theresistancefunctioncanproduceenoughvoltageto
forward-biassilicondiodeortransistorjunctions,causing
themtoconduct.
To
avoidthis,donotusethe40MΩrange
forin-circuitresistancemeasurements.
ℕ
On40MΩrange,themetermaytakeafewsecondsto
stabilizereading.Thisisnormalforhighresistance
measuring.
ℕ
Whentheinputisnotconnected,i.e.atopencircuit,
thefigure"OL"willbedisplayedfortheoverrange
condition.
3.2.3
3.2.3
3.2.3
3.2.3Diode
D iode
Diode
DiodeTest
T est
Test
Test
To
To
To
Toavoid
avoid
avoid
avoidelectrical
electrical
electrical
electricalshock
shock
shock
shockand/or
and/or
and/or
and/ordamage
damage
damage
damageto
to
to
tothe
the
the
the
instrument,
instrument,
instrument,
instrument,disconnect
disconnect
disconnect
disconnectcircuit
circuit
circuit
circuitpower
power
power
powerand
and
and
and
discharge
discharge
discharge
dischargeall
all
all
allhigh-voltage
high-voltage
high-voltage
high-voltagecapacitors
capacitors
capacitors
capacitorsbefore
before
before
before
testing
testing
testing
testingdiodes.
diodes.
diodes.
diodes.
Usethediodetesttocheckdiodes,transistors,andother
semiconductordevices.Thediodetestsendsacurrent
throughthesemiconductorjunction,thenmeasuresthe
voltagedropacrossthejunction,Agoodsiliconjunction
dropsbetween0.5Vand0.8V.
To
testadiodeoutofacircuit:
1.Settherotaryswitchto range.
2.PresstheSELECT
SELECT
SELECT
SELECTkeytoactivateDiodeTest.
3.ConnecttheblackandredtestleadstotheCOMand
VΩterminalsrespectively.
4.Forforward-biasreadingsonanysemiconductor
component,placetheredtestleadonthe
component'sanodeandplacetheblacktestleadon
thecomponent'scathode.
17
5.Themeterwillshowtheapprox.forwardvoltageofthe
diode.
Inacircuit,agooddiodeshouldstillproduceaforwardbias
readingof0.5Vto0.8V;however,thereverse-biasreading
canvarydependingontheresistanceofotherpathways
betweentheprobetips.
3.2.4
3 .2.4
3.2.4
3.2.4Continuity
C ontinuity
Continuity
ContinuityCheck
C heck
Check
Check
To
To
To
Toavoid
avoid
avoid
avoidelectrical
electrical
electrical
electricalshock
shock
shock
shockand/or
and/or
and/or
and/ordamage
damage
damage
damageto
to
to
tothe
the
the
the
instrument,
instrument,
instrument,
instrument,disconnect
disconnect
disconnect
disconnectcircuit
circuit
circuit
circuitpower
power
power
powerand
and
and
and
discharge
discharge
discharge
dischargeall
all
all
allhigh-voltage
high-voltage
high-voltage
high-voltagecapacitors
capacitors
capacitors
capacitorsbefore
before
before
before
testing
testing
testing
testingfor
for
for
forContinuity.
Continuity.
Continuity.
Continuity.
To
testforcontinuity:
1.Settherotaryswitchto range.
2.PresstheSELECT
SELECT
SELECT
SELECTkeytoactivateContinuityCheck.
3.ConnecttheblackandredtestleadstotheCOMand
Ωterminalsrespectively.
4.Connectthetestleadstotheresistanceinthecircuit
beingmeasured.
5.Whenthetestleadtothecircuitisbelow50Ω,a
continuousbeepingwillindicateit.
Note:
Note:
Note:
Note:
ℕ
Continuitytestisavailabletocheckopen/shortofthe
circuit.
3
3
3
3.
.
.
.2.5
2 .5
2.5
2.5Transistor
T ransistor
Transistor
Transistormeasurement
m easurement
measurement
measurement
To
To
To
Toavoid
avoid
avoid
avoidelectrical
electrical
electrical
electricalshock
shock
shock
shockand/or
and/or
and/or
and/ordamage
damage
damage
damageto
to
to
tothe
the
the
the
instrument,
instrument,
instrument,
instrument,do
do
do
donot
not
not
notapply
apply
apply
applymore
more
more
morethan
than
than
than250
250
250
250Vdc
Vdc
Vdc
Vdcor
or
or
or
250
250
250
250Vac
Vac
Vac
Vacrms
rms
rms
rmsbetween
between
between
betweenthe
the
the
thehFE
hFE
hFE
hFEterminal
terminal
terminal
terminaland
and
and
andthe
the
the
the
COM
COM
COM
COMterminal.
terminal.
terminal.
terminal.
18