NXP Semiconductors PN5180 - Fig 50. VNA;J from DL2 SBA (Refer to [13]); Fig 51. Impedance Measurement Result Example (Smith Chart)

NXP Semiconductors
AN11740
PN5180 Antenna design
AN11740
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Application note
COMPANY PUBLIC
Rev. 1.1 — 19 June 2018
345311
55 of 62
a. VNA/J with antenna coil measurement
b. VNA/J Smith chart example
Fig 50. VNA/J from DL2SBA (refer to [13])
In Fig 51 the result of the same measurement is shown for the R&S ZVL as well as for
the VNA/J using the miniVNAPro. The accuracy of the ZVL is much higher than the one
of the miniVNA Pro. However, for the antenna matching and tuning procedure as
described in this document, both devices can be used.
a. From R&S ZVL
b. From miniVNA Pro
Fig 51. Impedance Measurement result example (Smith chart)