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NXP Semiconductors PN5180 - 2.2.2 Power supply

NXP Semiconductors PN5180
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NXP Semiconductors
AN11740
PN5180 Antenna design
AN11740
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2018. All rights reserved.
Application note
COMPANY PUBLIC
Rev. 1.119 June 2018
345311
7 of 62
(1) Details see [3].
Fig 4. ISO/IEC 10373-6 ReferencePICC
Some ReferencePICCs, which are commercially available (e.g. Fig 5), are pre-calibrated
and equipped with several jumper options to address the most relevant tests with a
single ReferencePICC.
(1) The jumper settings allow the use of different pre-calibration settings.
Fig 5. ISO/IEC 10373-6 Reference PICC Class 1
Still for each PICC Class a separated ReferencePICC is required.
The most relevant analog tests for PCDs are:
1. Field strength test (min and max)
2. Wave shape tests (for all bit rates)
3. Load modulation amplitude tests

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