Protek Z9216 - Chapter 4: Binning; Using the LCR Meter to Sort Components; Binning Options and Examples

Chapter
4
Binning
Using the LCR Meter to Sort Components
The Model Z9216 has built in features to aid in component sorting, which is useful for production
testing, incoming inspection, device matching, or tests in which multiple components of similar value
must be measured. The binning feature simplifies parts sorting by eliminating the need to read the
major and minor parameters and then deciding what to do with the part. The STO and RCL keys
allow up to nine binning configurations to be entered and recalled. The configuration can also be
programmed over one of the computer interfaces. The Model Z9216 can sort components into as
many as ten separate bins-eight pass bins, a minor parameter failure bin, and a general failure bin.
Binning operations can either be performed using the keys in the BINS group of keys, over the
standard RS232 computer interface, or over the optional GPIB or Handler interface.
Binning Options
Three different types of binning schemes are supported by the Model Z9216: Pass/Fail, Overlapping,
and Sequential. Pass/Fail has only two bins; good parts and all others. Overlapping (nested) bins
have one nominal value and are sorted in progressively larger bins (for example, ±1%, ±2%, ±3%,
etc.). Sequential bins can have different nominal values, each separated by a percentage (for
example, 0.9*nom, 0.95*nom, 1.0*nom, 1.05*nom, with 5% limits). Alternatively, sequential bins can
be set up with a single nominal value and asymmetrical limits (for example, −3% to −1%, −1% to 1%,
to 3%). Bin limits are pairs and can be symmetrical (for example, ±2%) or asymmetrical (for example,
−5% to −1%).
Binning Examples
Nested Bins
Suppose that a batch of 100 Ω resistors are to be sorted according to tolerance. The bins can be set
up for this purpose as follows:
Bin 0: 99 Ω < R < 101 Ω (±1%)
Bin 1: 98 Ω < R < 99 Ω, 101 Ω < R < 102 Ω (±2%)
Bin 2: 97 Ω < R < 98 Ω, 102 Ω < R < 103 Ω (±3%)
Bin 3: 96 Ω < R < 97 Ω, 103 Ω < R < 104 Ω (±4%)
Bin 8: QDR (quality deficiency report) failure (if Q is too high)
Bin 9: General failure bin (parts not falling into any other bin)
Figure 4-1 illustrates\ this example of nested bins.