EasyManua.ls Logo

Samsung QN55LS01RAF - Factory Data: Test Patterns and Upgrades

Samsung QN55LS01RAF
100 pages
To Next Page IconTo Next Page
To Next Page IconTo Next Page
To Previous Page IconTo Previous Page
To Previous Page IconTo Previous Page
Loading...
Factory Menu Name Data Range
Test Pattern
Scaler Pattern OFF
US Post Pattern OFF
FRC Pre Pattern 0
FRC Post Pattern 0
SOC TCON Pattern 0
SOC TCON Pattern Level 255
FRC OSD Pre Pattern 0
FRC OSD Post Pattern 0
FRC2 Pre Pattern 0
FRC2 Post Pattern 0
SOC TCON2 Pattern 0
SOC TCON2 Pattern Level 255
Upgrade
T-CON DATA UPGRADE
T-CON FW UPGRADE
T-CON CheckSum
T-CON2 Usb Download
T-CON2 CheckSum
PANEL EEPROM UPGRADE
PANEL FLASH UPGRADE
Logic Usb D/L
SUBMICOM UPGRADE * Upgrade Sub-Micom Program
SUBMICOM JP USB UPGRADE
BT UPGRADE
BT FREEPAIRING
Function Upgrade
FRC3D FW UPGRADE
FRC3D SRP UPGRADE
FRC3D LD UPGRADE
FRC2 3D FW UPGRADE
Camera Upgade * Upgarde Camera module(There is upgrade
program in Main-Image)
Mic Upgrade * Upgarde MIC in Camera module(There is
upgrade program in Main-Image)
Jump UPGRADE
IR Blaster Upgrade
IR Blaster delay time
4-35
4. Troubleshooting

Related product manuals