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Detailed steps for safely removing the specimen holder from the airlock.
Procedures for placing a specimen grid into the holder and securing it.
Instructions for inserting the loaded specimen holder into the airlock.
Steps to locate and confirm the presence of the electron beam.
Procedure for adjusting the gun tilt to optimize beam brightness.
Steps to align the beam using gun shift controls for stable positioning.
Process for centering the condenser aperture for proper beam illumination.
Correcting condenser astigmatism for a symmetrical beam shape.
Adjusting specimen height to align with the eucentric plane.
Adjusting beam tilt to minimize movement during focus changes.
Procedure for centering the beam using beam shift controls.
Aligning the image center for high-resolution imaging by minimizing rotation.
Centering the objective aperture in the diffraction plane.
Correcting objective astigmatism using FFT analysis for circular rings.
Controls and modes for operating the CCD camera.
Procedures for saving acquired images to storage.
Creating and applying dark/gain references to correct image artifacts.
Steps to prepare the microscope for the next user.
Additional steps for the last user, including cryo cycle and logging.
Steps to diagnose and resolve issues with no electron beam detection.
How to re-initialize unresponsive control pads and check for side effects.
Methods to locate missing objective or SA apertures.
Ensuring dark and gain references are applied to prevent image artifacts.
Adjusting trackball sensitivity to resolve unresponsiveness.
Verifying MF knob assignments for diffraction shift.
Reducing specimen drift caused by environmental factors or sample instability.
Guidance on restarting software and logging out to resolve unexpected behavior.
Instructions for accessing saved microscope images remotely via SFTP.
Information on subscribing to mailing lists for instrument updates and communication.
| Type | Transmission Electron Microscope (TEM) |
|---|---|
| Resolution | 0.34 nm |
| Magnification | Up to 1, 000, 000x |
| Filament Type | Tungsten or LaB6 |
| Imaging Modes | Bright field, Dark field |
| Specimen Holder | Single tilt, double tilt |
| Vacuum System | High vacuum system |
| Gun Type | Thermal emission gun |
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