Test records
62 AFG31000 Series Arbitrary Function Generator Specification and Performance Verification Technical Reference
DC test record: CH1 (Calibration factor (CF) = 2 / (1 + 50 Ω / Measurement Ω) =)
DC offset Minimum Test result Maximum
–2.500 VDC (–2.500 × CF – 0.026) VDC (–2.500 × CF + 0.026) VDC
DC test record: CH2 (Calibration factor (CF) = 2 / (1 + 50 Ω / Measurement Ω) =)
DC offset Minimum Test result Maximum
0.000 VDC –0.001 VDC 0.001 VDC
–2.500 VDC (–2.500 × CF – 0.026) VDC (–2.500 × CF + 0.026) VDC
AC flatness test record: CH 1
AC flatness Minimum Test result Maximum
Frequency 1.00 kHz
(Amplitude: 4.0 dB)
Frequency 500 KHz Reference – 0.20 dB
Reference + 0.20 dB
Frequency 50.00 MHz Reference – 0.50 dB
Reference + 0.50 dB
Frequency 150.00 MHz Reference – 1.00 dB
Reference + 1.00 dB
AC flatness test record: CH 2
AC flatness Minimum Test result Maximum
Frequency 1.00 kHz
_____ dB ( = Reference) _____
Frequency 1.00 MHz Reference – 0.20 dB
Reference + 0.20 dB
Frequency 15.00 MHz Reference – 0.30 dB
Reference + 0.30 dB