Test records
AFG31000 Series Arbitrary Function Generator Specification and Performance Verification Technical Reference 65
DC test record: CH1 (Calibration factor (CF) = 2 / (1 + 50 Ω / Measurement Ω) =)
DC offset Minimum Test result Maximum
(–2.500 × CF – 0.026) VDC
(–2.500 × CF + 0.026) VDC
DC test record: CH2 (Calibration factor (CF) = 2 / (1 + 50 Ω / Measurement Ω) =)
DC offset Minimum Test result Maximum
+2.500 VDC (2.500 × CF – 0.026) VDC (2.500 × CF + 0.026) VDC
(–2.500 × CF – 0.026) VDC
(–2.500 × CF + 0.026) VDC
AC flatness test record: CH 1
AC flatness Minimum Test result Maximum
Frequency 1.00 kHz
_____ dB ( = Reference) _____
Frequency 5.00 MHz Reference – 0.30 dB
Reference + 0.30 dB
Frequency 25.00 MHz Reference – 0.50 dB
Reference + 0.50 dB
Frequency 100.00 MHz Reference – 1.00 dB
Reference + 1.00 dB
Frequency 200.00 MHz Reference – 2.00 dB
Reference + 2.00 dB
AC flatness test record: CH 2
AC flatness Minimum Test result Maximum
Frequency 1.00 kHz
(Ampl: 4.0 dBm)
Frequency 500. KHz Reference – 0.20 dB
Reference + 0.20 dB
Frequency 5.00 MHz Reference – 0.30 dB
Reference + 0.30 dB