Description
Description
The CT-1 (1 GHz) and CT-2 (200 MHz) are current probes designed for either
permanent or temporary installation in the device-under-test (DUT). These
probes are pa
rticularly useful for measuring high-frequency currents in solid state
circuitry with minimum circuit loading. Due to bidirectional compatibility, the
CT-1 and CT-2 can be used to inject a signal or as an interstage transformer.
The probes inductively measure current through a conductor and develop a
voltage proportional to the current. For each mA of input current the signal
terminal develops 5 mV (CT-1) or 1 mV (CT-2) when properly terminated into
50 Ω. The sensitivity of the CT-1 is 5 mV/mA (200 μA/mV) and the CT-2 is
1 mV/mA (1 mA/mV) when properly terminated into 50 Ω.
Since the CT-1 and the CT-2 are dynamic current probes (non-DC), the presence
of DC current affects their performance. The following figures show the influence
of DC cur
rent on frequency response.
This response was obtained with the + side of the CT-1 facing the signal source
(preferred connection above 800 MHz).
Figure 2: CT-1 frequency response vs. DC current
2 CT-1 and CT-2 Curr ent Transformer Instructions
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