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Tektronix TDS 520A Service Manual

Tektronix TDS 520A
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Typical Characteristics
Specifications
1Ć22
TableĂ1Ć13:ăTypical Characteristics Ċ Signal Acquisition System (Cont.)
Name Description
$! #! # $$ "" "#
     #
      '
Volts/Div Setting Step
Amplitude
Settling Error (%)
3
& &
 &(&
& &
v
v
v
20 ns
v
v
v
100 ns
v
v
v
20 ms
v
v
v
1 The limits are given for signals having pulse height 5 div, reference level = 50% midĆpoint, filter set to Sin (x) /x acquired at 5
mV/div, 1.4 v
Tr
/
Si
v 5, where S
i
is the hardware sample interval and t
r
is the signal rise time.
2 The numbers given are valid 0_Cto+30_C and will increase as the temperature increases due to the degradation in bandwidth.
Rise time is calculated from the bandwidth. It is defined by the following formula:
RiseĄ TimeĄ(ns) +
400
BWĄ(MHz)
Note that if you measure rise time, you must take into account the rise time of the test equipment (signal source, etc.) that you
use to provide the test signal. That is, the measured rise time (RT
m
) is determined by the instrument rise time (RT
i
) and the rise
time of the test signal source (RTgen) according to the following formula:
RT
m
Ą
2
+ RT
i
Ą
2
) RT
gen
Ą
2
3 The values given are the maximum absolute difference between the value at the end of a specified time interval after the midĆlevel
crossing of the step, and the value one second after the midĆlevel crossing of the step, expressed as a percentage of the step
amplitude.
TableĂ1Ć14:ăTypical Characteristics Ċ Time Base System
Name
Description
!"$%" "$$' v!#

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Tektronix TDS 520A Specifications

General IconGeneral
BrandTektronix
ModelTDS 520A
CategoryTest Equipment
LanguageEnglish

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